advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Agilent Technologies

Company Profile

Contact Information

Phone: (800) 829-4444
Fax: (800) 829-4433

Location

Agilent Technologies
5301 Stevens Creek Blvd.
Santa Clara CA 95051
United States
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in chemical analysis, life sciences, electronics and communications. The company's 18,500 employees serve customers in more than 100 countries. Agilent had net revenues of $5.4 billion in fiscal 2010.

Products

High Performance Real-Time Spectrum Analysis

February 08, 2013

image002_lowAgilent Technologies Inc. announced the availability of real-time spectrum analysis (RTSA) for its PXA X-Series signal analyzers. Agilent's RTSA delivers unmatched probability of intercept (POI), analysis bandwidth, sensitivity, and frequency range-capabilities that make it the best way for system developers and signal analysts to see, capture and understand highly elusive signals.

Read More

Mixed Signal Oscilloscope: Infiniium 90000 X-Series

January 28, 2013

9000seriesMSOAgilent Technologies Inc. announced the expansion of its award-winning Infiniium 90000 X-Series oscilloscope family to include the world’s highest performance mixed-signal oscilloscope, or MSO. The expansion adds six new MSO models, as well as 13-GHz DSO and DSA models, to the X-Series.

Read More

MIPI Protocol Decoders: N8808A and N8809A

November 28, 2012

MIPIprotocolDecoderAgilent’s N8808A UniPro and N8809A LLI protocol decoders are designed to run on the company’s Infiniium 90000 Series oscilloscopes. They enable protocol decoding for the MIPI Alliance’s UniPro v1.41 and LLI v1.0 specifications. The software supports MIPI M-PHY Gear-3 speeds of up to 5.8 Gbps and R&D design teams can use the software to address their start-up debug and validation needs.

Read More

Low-Noise Power Sources: B2961A / B2962A

November 01, 2012

B2962A-B2961AAgilent Technologies Inc. introduced two new low-noise power sources. Members of the Agilent B2900A precision instrument family, the one-channel B2961A and the two-channel B2962A are revolutionary power supplies for precision low-noise voltage/current sourcing. They incorporate revolutionary performance and innovative sourcing capabilities beyond just a DC power source for every research and industry area.

Read More

CXA Signal Analyzer: N9000A

October 17, 2012

N0000AcxaAgilent Technologies Inc. announced two new frequency options for the N9000A CXA X-Series signal analyzers. The new options provide a low-cost solution for essential microwave signal characterization up to 13.6 GHz and 26.5 GHz.To help customers meet tighter test requirements and enhance test margins, the N9000A CXA signal analyzercapabilities include 163 dBm displayed average noise level (DANL) at 1 GHz and 147 dBm at 26.5 GHz with preamplifier on.

Read More

Handheld Digital Multimeter: U1273AX

October 09, 2012

U1273AXAgilent Technologies Inc. announced the U1273AX OLED handheld digital multimeter, which can operate in temperatures as low as -40 C. Even in such frigid conditions, the new handheld DMM provides accurate results with no warm-up time required. When paired with the U1583B AC current clamp, the U1273AX supports current measurements without breaking the circuit under test.

Read More

Sampling Head Oscilloscope Module: N1045A

September 18, 2012

N1045AThe Agilent N1045A 2/4-port electrical remote sampling head module provides the most economical solution for accurately characterizing multilane designs used in today’s new and emerging standards such as IEEE 802.3 ba/bj/bm (40/100 Gb Ethernet) and Optical Internetworking Forum CEI 3.0. Users can configure up to four N1045A modules in a single Agilent 86100D DCA-X wide-bandwidth oscilloscope mainframe.

Read More

Real-Time Optical Modulation Analyzer: N4391A

September 12, 2012

N4392AAgilent Technologies Inc. announced the industry’s first real-time optical modulation analyzer with a bandwidth of 63 GHz. The N4391A real-time optical modulation analyzer offers comprehensive tools to analyze and quantify the integrity of a vector-modulated signal for error-vector magnitude, quadrature error and other impairments. The new instrument allows researchers to characterize the latest coherent receivers and ultrafast transmitters.

Read More

Receiver Test Software: N5393C Option 004 PCI Express 3.0

August 27, 2012

PCIexpress3.0RecTestSoftwareAgilent Technologies Inc. announced the industry’s first fully integrated PCI Express® (PCIe®)3.0 receiver test calibration and transmitter test software. The software provides an integrated environment for calibrating the stressed voltage and stressed receiver eye using an Agilent J-BERT bit error-ratio tester, an Agilent 90000A-, Q- or  X-Series oscilloscope, an Agilent pulse function generator and Agilent PCI Express 3.0 calibration test channels.

Read More

Infiniium 90000 Q-Series Oscilloscopes

May 07, 2012

90000QseriesIntroducing 90000 Q-Series Agilent’s latest step forward in the application of microwave expertise to real-time oscilloscopes. At the extremes of electrical and optical measurements, the right oscilloscope will help you explore the “what” and also understand the “why.” That’s the idea behind Agilent’s Q-Series. Even at its industry leading bandwidths, the Q-Series lets you see your fastest signals as they really are. Equip your lab with the Q-Series—and achieve your real edge.

Read More

X-Series Signal Generators

May 01, 2012

COLL-1000004011.epsgAgilent announced four new X-Series signal generators that provide unmatched performance in phase noise, output power, ACPR, EVM and bandwidth. Agilent’s new MXG and EXG products support the development of components and receivers that meet the complex challenges of mitigating interference, speeding data throughput and more.

Read More

PXI Vector Signal Analyzer

April 04, 2012

AnalyzerM9392AAgilent Technologies has announced the availability of the first dual-channel PXI vector signal analyzer that delivers high-bandwidth, independently tuned, two-channel, continuous data capture. This product is a new configuration of Agilent's M9392A analyzer.

Read More

Genesys 2012 Software

February 16, 2012

Genesys12softwareAgilent announces the latest release of its industry-leading, low-cost, high-performance software for RF and microwave board design, Genesys 2012. The updated software provides enhancements in RF system simulation (including electromagnetic, circuit and statistical simulation), plus features to help designers improve the reliability of their systems.

Read More

2010 Agilent Satellite Test Poster and App Notes

January 17, 2011

SatelliteAgil100These Satellite Test resources provide the latest technical insights and best practices to help you focus on what matters most; the assurance that satellites and subsystems will work the first time, every time for the duration of the mission.

Read More

ADS 2009 Update 1

January 17, 2011

ads2009_100ADS 2009 Update 1 delivers new features and improved value for all ADS users with special focus on MMIC and RF Module design, including enhancing the complete flow to manufacturing. These new features eliminate the time to integrate disparate point tools from numerous vendors (e.g. 3D EM and Layout).

Read More

Advanced Design System - 2008

January 17, 2011

SatelliteAgil100Advanced Design System is a powerful electronic design automation software system. It offers complete design integration to designers of products such as cellular and portable phones, pagers, wireless networks, radar and satellite communications systems, and high-speed digital serial links.

Read More

Advanced Design System - 2009

January 17, 2011

ads_175x225_100ADS is a powerful electronic design automation software system. It offers complete design integration to designers of products such as cellular and portable phones, pagers, wireless networks, radar and satellite communications systems, and high-speed digital serial links.

Read More

Agilent EEsof System-level X-Parameters

January 17, 2011

RS222-100System-level X-parameters in SystemVue 2010 and Genesys 2010 provide Architecture-to-Verification Design Flow Closure. The nonlinear model support provides convenient and reliable design flow closure between wireless circuit designers, RF system architects, and non-analog colleagues.

Read More

Agilent N9000A CXA Signal Analyzers

January 17, 2011

cxa100The Agilent CXA signal analyzer is a versatile, low-cost tool for essential signal characterization. This low-cost member of Agilent’s X-Series signal analyzers helps accelerate product testing and development while reducing costs.

Read More

Agilent N9030A PXA Signal Analyzer

January 17, 2011

PXAcombo100The N9030A PXA is the highest-performing member of Agilent’s X-Series signal analyzers, providing coverage up to 26.5 GHz and ensuring present and future flexibility through optional measurement capabilities and hardware expandability.

Read More

Attenuators

January 17, 2011

11713B_11713_100Agilent offers a broad range of attenuators from DC to 60 GHz with multiple attenuation range up to 121 dB. Agilent attenuators provide the best reliability and repeatability in the industry for highly accurate signal conditioning and level control, such as: reducing signal levels, matching impedances of sources and loads, and measuring gain or loss.

Read More

EMPro - Agilent’s Integrated 3D EM Design Platform

January 17, 2011

SaliousPic100Electromagnetic Professional (EMPro), is Agilent's new design platform for analyzing the electromagnetic effects of RF and microwave components such as high-speed IC packages, antennas, on-chip and off-chip embedded passives, and PCB interconnects.

Read More

External Output Amplifier 33502A

January 17, 2011

Agilent3350-100Agilent Technologies Inc. (NYSE: A) today introduced an economically priced 2-channel external output amplifier that provides up to 50 Vpp (Volts peak-to-peak) amplification of function/arbitrary waveforms. The instrument is designed to work in conjunction with engineers’ existing function generators to extend the voltage range and offer low-distortion outputs.

Read More

FieldFox RF Interference Analyzer

January 17, 2011

Agilent_fire100Agilent Technologies Inc. (NYSE: A) today introduced an interference analyzer option for its popular FieldFox RF Analyzer, the world's most integrated RF handheld for wireless installation and maintenance (I&M). The company also introduced new, industry-first spectrum analyzer features.

Read More

Genesys

January 17, 2011

genesysST100The Agilent Genesys product line provides self-supporting RF design teams and individuals with affordable, high-performance circuit and system design tools. Genesys reduces costs for traditional RF & microwave planar design by accelerating time-to-market with key productivity advantages, and an array of simulation technology.

Read More

GoldenGate RFIC Simulator

January 17, 2011

goldengate100GoldenGate is the leading RFIC Simulator platform delivering high capacity and unique analysis for full chip verification and design for yield. Developed for the specific needs of RFIC/Wireless designers, GoldenGate is fully integrated into the Cadence Analog Design Environment (ADE).

Read More

GoldenGate version 4.4

January 17, 2011

Agilent_100Agilent Technologies Inc. (NYSE: A) today announced the release of its RFIC simulation, verification and analysis software -- GoldenGate version 4.4. This release extends Agilent's leadership in advanced node RFIC design with enhanced performance, new key stability and yield analyses, and RF extensions to mixed-signal simulation.

Read More

IC-CAP

January 17, 2011

icCAP100IC-CAP (Integrated Circuit Characterization and Analysis Program) is a device modeling program that provides powerful characterization and analysis capabilities for a broad range of semiconductor modeling processes.

Read More

Infiniium 90000 X-Series High-Performance Oscilloscopes

January 17, 2011

AgilentDSA10016 to 32 GHz real-time lab scopes with 2 Gpts memory, the industry’s highest real-time scope measurement accuracy, the industry’s only 30 GHz oscilloscope probing system, and the industry’s first application-specific measurement software.

Read More

N2792A and N2793A Differential Probes

January 17, 2011

AgilentN27-100Agilent Technologies Inc. (NYSE: A) today introduced 200-MHz and 800-MHz, high-voltage differential probes. The differential probes provide superior general-purpose differential signal measurements required for today’s high-speed power measurements, vehicle bus measurements and digital system designs.

Read More

N2884A InfiniiMax

January 17, 2011

Probe01low100Agilent Technologies Inc. (NYSE: A) today introduced a 12 GHz differential wafer probing solution. The fine-wire probe tip is a high-fidelity, high-bandwidth solution that allows R&D and test engineers to debug and test high-speed active ICs using an oscilloscope. The N2884A InfiniiMax differential fine-wire probe tip uses Agilent's low-cost, ZIF probe head technology.

Read More

New Digital Test Console

January 17, 2011

Agilentlow100Agilent Technologies Inc. (NYSE: A) today introduced its PCIe® 3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry's only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI Express 3.0 specification.

Read More

One- and Two-Arm Probe Positioners

January 17, 2011

AgilentProb100The N2784A and N2785A one- and two-arm probe positioners provide quick and stable X-Y positioning using a simple “lift and drop” motion to set the probe in place.  The N2784A probe positioner provides quick and stable X-Y positioning with only a “lift and drop” motion to put the probe in place for PC boards and devices that require hands-free probing.

Read More

PNA-X Microwave Network Analyzer Family

January 17, 2011

AgilentN52-100Agilent's PNA-X microwave network analyzer family provides the world's widest range of measurement applications for amplifiers, mixers/converters, or antennas, with a single connection. Measurement applications include noise figure, gain compression, intermodulation distortion (IMD), the award-winning nonlinear application, and more.

Read More

PNA-X Series of Network Analyzers

January 17, 2011

RS-233-100Agilent’s PNA-X Series of microwave network analyzers now offer high accuracy, source-corrected noise-figure measurements of frequency converters and mixers, as well as amplifiers. For measurements up to 26.5 GHz, an internal low-noise receiver is available that eliminates the need for an external preamplifier.

Read More

Power Splitters and Power Dividers (Combiners)

January 17, 2011

Powersplitt100Agilent power splitters and dividers provide minimal insertion loss and high port isolation for highly accurate transmission line fault testing, power combining, source leveling, ratio measurements, power splitting, and critical signal processing.

Read More

PXI Microwave Switches

January 17, 2011

M9155-6-7-100Agilent offers a new PXI hybrid switch module series that operates from a frequency range from DC to 26.5 GHz.   It is being used in applications such as Automatic Test Equipment (ATE), RF communications measurements where a rugged switching module is needed in high density switching systems.

Read More

Radar Fundamentals Poster

January 17, 2011

RadarPost100The Radar Fundamentals poster has picturesque displays of PRF, radar block diagrams, basic equations, standard nomenclature and the latest radar equipment for your toughest radar test challenges.

Read More

RF and Microwave Switches

January 17, 2011

87106D_2-100Agilent offers a broad range of RF and microwave switches in a wide variety of configurations from DC to 50 GHz. Their switches provide high accuracy and repeatability for automated test and measurement, signal monitoring and routing applications.

Read More

RF Probes

January 17, 2011

N9020A_U100Agilent offers an innovative family of RF probes that are engineered for in-circuit test measurement that can be used with signal/spectrum analyzers, signal source analyzers and network analyzers. With operating frequency of up to 12 GHz, the RF probes provide flat frequency response and low noise floor.

Read More

SystemVue

January 17, 2011

systemvue100SystemVue is a focused EDA environment for electronic system-level (ESL) design that allows system architects and algorithm developers to innovate the physical layer (PHY) of next-generation wireless and aerospace/defense communications systems.

Read More

SystemVue 2009.08

January 17, 2011

Agilent Syst100Agilent Technologies Inc. (NYSE: A) today announced that SystemVue version 2009.08 is now available for download. It features a number of new capabilities including an automated link that unlocks RF-DSP co-design and a fully custom, high-performance baseband signal processing design flow.

Read More

U2000 Series USB Power Sensors

January 17, 2011

Agilent-U2000-100Agilent U2000 Series USB-based power sensors, except for U2004A, now come with internal triggering and trace display capability. Internal triggering enables triggering based on the burst signal envelope so no external signal triggering is needed. Trace display provides a graphical view of the signal envelope to assist in gate placement

Read More

U8903A Audio Analyzer

January 17, 2011

Agilent_100Agilent Technologies Inc. (NYSE: A) today introduced a single-unit solution - the U8903A audio analyzer -- that helps users quantify characteristics that affect sound quality in audio devices. The Agilent U8903A is also the next-generation replacement for the widely used legacy 8903B audio analyzer.

Read More

News

Agilent to demonstrate leading-edge design and test solutions at IMS 2013

May 22, 2013

Agilent Technologies Inc. will demonstrate 25 of its newest design and measurement solutions at the IEEE MTT-S International Microwave Symposium (Booth 1230), June 2-7, at the Washington State Convention Center in Seattle.

Read More

Agilent enhances electronic instrument control and automation software

May 10, 2013

Agilent Technologies Inc. announced the latest enhancement on its Command Expert software for faster and easier instrument control in many test application development environments.

Read More

Agilent announces enhancements to automate Verizon IMS VoIP compliance test plan

May 06, 2013

Agilent Technologies Inc. announced enhancements to its N5973A Interactive Functional Test Automation for Verizon Wireless Compliance Test Plans software, including new scripts to automate Verizon's IMS voice-over-IP compliance test plan.

Read More

Agilent outfits UC Berkeley electronics lab with $300,000 of test equipment

April 12, 2013

Agilent Technologies Inc. announced that it  donated bench-top electronic measurement equipment worth $300,000 to the Texas Instruments Electronics Design Laboratory, which opened at the University of California, Berkeley. The new lab will provide more than 1,000 Berkeley students each year with hands-on experience applying the principles they learn in gateway electrical engineering courses such as microelectronic circuit design.

Read More

Agilent simulation software selected by Plextek RF Integration

March 28, 2013

Agilent Technologies Inc. announced that Plextek RF Integration, a UK-based  company that designs and develops RFICs, MMICs and microwave/millimeter-wave modules, has selected Agilent software to simulate its new high-frequency circuit and MMIC designs.

Read More

Agilent announces standard 3-year warranty for all electronic test instruments

March 01, 2013

Agilent Technologies Inc. announced that all new Agilent electronic test instruments sold after this date will be covered by a “bumper-to-bumper” three-year repair warranty. The increase from one year to three years is the result of ongoing quality initiatives that, from 2002 to 2012, yielded unprecedented improvements in product reliability and earned top marks in an independent customer survey rating RF and microwave product quality.

Read More

Agilent helps students acquire real-world EDA skills with new licensing program

February 28, 2013

Agilent Technologies Inc. launched the Agilent EEsof EDA Student License Program, designed to provide access to Agilent EEsof EDA software on students’ personal computers. 

Read More

Agilent introduces wireless communications test set with integrated multiport adapter

February 26, 2013

Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.

Read More

Agilent announces host adapter for MIPI Alliance DigRF v4 RFICs

February 22, 2013

Agilent Technologies Inc. announced a new protocol testing solution for MIPITM Alliance Gear2 DigRf v4 RFICs. The Agilent M9252A DigRF host adapter allows developers to speed testing and analysis of RFICs used in cellular phones, tablets and other mobile devices.

Read More

Agilent launches versatile benchtop boundary scan analyzer for electronic test

February 20, 2013

Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.

Read More

Agilent introduces first UFS protocol-decoding software for oscilloscopes

February 19, 2013

Agilent Technologies Inc. introduced the industry’s first software solution for decoding the Universal Flash Storage (UFS) protocol on oscilloscopes. The new protocol decoder provides design and validation engineers with a fast, easy way to validate and debug their UFS interfaces.

Read More

Agilent’s newest SystemVue software release accelerates MIMO radar and wireless/4G design

February 15, 2013

Agilent Technologies Inc. announced the newest release of SystemVue, its premier platform for designing communications and defense systems.

Read More

Agilent introduces comprehensive compliance testing for EEE standards

February 14, 2013

Agilent Technologies Inc. introduced compliance testing support for Energy-Efficient Ethernet (EEE) standards used in networking applications. Agilent’s solution for transmitter tests includes 10BASE-T, 100BASE-T and 1000BASE-T EEE test standards as described in the IEEE 802.3az-2010 specification.

Read More

Agilent and distributors host seminar series for hands-on electronic test

February 06, 2013

What: Agilent’s complimentary A+ Seminar Series, given by its technical expert distributors, is designed to provide hands-on labs, working sessions, tips, techniques, best practices and skills development.

Read More

Agilent commits $90 M gift of software to Georgia Tech laboratory

February 05, 2013

Agilent Technologies Inc. announced the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

Read More

Agilent to demo new solutions enabling tests from prototype validation to inline high-volume manufacturing at IPC APEX

February 01, 2013

Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.

Read More

Agilent introduces industry's lowest-priced USB 2.0 signal-quality test option

January 29, 2013

Agilent Technologies Inc. introduced the industry’s lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications.

Read More

Agilent introduces enhanced solution for PCI Express 3.0 receiver characterization

January 28, 2013

Agilent Technologies Inc. announced an enhanced solution for PCI Express® 3.0 receiver characterization at DesignCon.

Read More

Agilent announces video on 8x8 LTE MIMO

January 28, 2013

Agilent Technologies Inc. announced a new video, "8x8 LTE MIMO Analysis - N7109A Signal Analyzer - 89600 VSA - SystemVue."  See how new 8x8 MIMO simulation and measurement capabilities help LTE basestation designers stay ahead of rapidly evolving LTE standards test requirements.

Read More

Agilent unveils waveform generator support for HDMI and MHL sink tests

January 25, 2013

Agilent Technologies Inc. announced support for the High-Definition Multimedia Interface (HDMI) and Mobile High-Definition Link (MHL) sink tests through its M8190A arbitrary waveform generator and enhanced N5990A test-automation software.

Read More

Agilent introduces benchtop digital multimeter designed to turbocharge electronic T&M applications

January 22, 2013

Agilent Technologies Inc. announced the 34450A 5½ digit Benchtop Digital Multimeter, designed to turbocharge electronic test and measurement applications for industrial and educational use.

Read More

Leti and Agilent to present results on MM-wave short-range communication integrated systems IEEE SiRF

January 18, 2013

CEA-Leti and Agilent Technologies will present their recent research results in the field of embedded integrated systems at the IEEE Silicon Monolithic Integrated Circuits in RF Systems (SiRF) Conference in Austin, TX, Jan. 21-23.

Read More

Agilent to demonstrate newest high-speed digital design and test solutions at DesignCon

January 16, 2013

Agilent Technologies Inc. announced it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).

Read More

Agilent announces opening of calibration and repair service center for test instruments in Vietnam

January 04, 2013

Agilent Technologies Inc. announced the opening of a new calibration and repair service center for electronic test instruments in Hanoi, Vietnam. The new Agilent Advantage Services facility will offer local calibration and repair services, adding to more than 50 service locations around the world.

Read More

Agilent introduces industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions

January 03, 2013

Agilent introduced the industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions. The offerings complement Agilent's other industry-first solutions for the LTE-Advanced standard.

Read More

Agilent announces application note on the 89600 VSA software simultaneous multi-measurement capabilities

December 26, 2012

Agilent’s new application note describes how the 89600 VSA software’s multi-measurement capability facilitates testing wireless devices and systems handling multiple carriers and formats at the same time.

Read More

Agilent demonstrates test solutions at SDR-WInnComm

December 21, 2012

Agilent will demonstrate the following test solutions:

Read More

Agilent unveils new IC-CAP platform for device characterization and modeling

December 20, 2012

With IC-CAP 2013.01, Agilent introduces major improvements to its flagship product for high-frequency device modeling. One key improvement is turnkey extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices.

Read More

Agilent ships new ADS software

December 10, 2012

Agilent Technologies Inc. (NYSE: A) announced shipment of Advanced Design System 2012, its flagship RF and microwave EDA software platform.

Read More

Agilent announces new webcast on calibration service for test and measurement equipment

December 05, 2012

Agilent Technologies Inc. announced the new webcast, “Calibration Traceability and Standards Compliance,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI.

Read More

Agilent adds wireless connectivity to clamp meters

December 03, 2012

Agilent Technologies Inc. announced the addition of wireless connectivity to its U1210 Series clamp meter. It also added new capabilities, including voice output and remote hosting, to the Mobile Meter and Mobile Logger applications that support the company’s wireless connectivity solution for handheld digital multimeters and clamp meters.

Read More

Agilent introduces basic spectrum analyzer for budget-driven applications

November 30, 2012

Agilent Technologies Inc. announced a new basic spectrum analyzer for budget-constrained applications in R&D, manufacturing, maintenance, educationlabs, spectrum management, benchrepair and other general-purpose analyzer applications.

Read More

Agilent extends high-performance noise-figure measurement technique to 50 GHz

November 29, 2012

Agilent Technologies Inc. announced the extension of its source-corrected noise-figure measurement capability in PNA-X network analyzers to 43.5 and 50 GHz, while continuing to maintain the highest noise-figure measurement accuracy in the industry. Built directly into the Agilent PNA-X, the technique provides a complete single-connection, multiple-measurement capability for R&D and manufacturing engineers developing and testing low-noise transistors, amplifiers, frequency converters and transmit/receive modules.

Read More

Agilent opens PicoCafé, an online forum for atomic force microscope users

November 28, 2012

Agilent Technologies Inc. announced the launch of its online Pico Café, an interactive web community created exclusively for atomic force microscope users. Agilent AFM users from around the world are invited to visit the new PicoCafé at www.agilent.com/find/picocafe to share original script programming and instrumentation-related insights with one another.

Read More

Agilent recognized by Frost & Sullivan for outstanding customer service in Brazil

November 20, 2012

Agilent Technologies Inc. announced that Frost & Sullivan recognized the company for significant customer-centric initiatives and leadership in Brazil’s electronic test and measurement market, presenting Agilent with the 2012 Brazilian Frost & Sullivan Award for Customer Service Leadership.

Read More

Agilent ships newest GoldenGate software release for RFIC designers

November 20, 2012

Agilent Technologies Inc. announced shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.

Read More

Agilent to present at Wireless Connectivity in Medical Devices conference

November 19, 2012

Agilent Technologies Inc. will present at the Wireless Connectivity in Medical Devices Conference, Nov. 28. at the Langham Boston Hotel in Boston, MA.

Read More

Agilent ships newest EMPro software release for analyzing 3-D electromagnetic effects

November 16, 2012

Agilent Technologies Inc. announced shipment of EMPro 2012, its 3-D electromagnetic simulation software.

Read More

Agilent and Notre Dame team up on MIMO wireless technologies

November 15, 2012

Agilent Technologies Inc. and the Wireless Institute at the University of Notre Dame announced that they will establish a collaborative research initiative aimed at developing the next generation of multiple-input, multiple-output wireless technologies.

Read More

Agilent redefines the oscilloscope experience

November 14, 2012

Agilent Technologies Inc. introduced the groundbreaking InfiniiVision 4000 X-Series digital-storage and mixed-signal oscilloscopes. This new series establishes unprecedented levels of flexibility and ease of use among units that use an embedded operating system.

Read More

Agilent introduces high-precision PXI frequency reference module for electronic measurements

November 13, 2012

Agilent Technologies Inc. introduced a high-precision PXIe frequency reference. The Agilent M9300A generates clean 10-MHz and 100-MHz signals for high-performance RF systems.

Read More

Agilent FieldFox handheld analyzer demonstration videos now available

November 09, 2012

Agilent Technologies Inc. introduces a new series of eight videos are available that demonstrate how Agilent FieldFox handheld analyzers make precise microwave measurements in field-test environments such as satellite communications, microwave backhaul, military communications and radar systems.

Read More

Agilent announces expansion of Hermon Labs’ acoustic wireless handset conformance test solution

November 08, 2012

Agilent Technologies Inc. announced that Hermon Labs has expanded its acoustic testing for GSM, CDMA, W-CDMA and 3GPP to include the latest acoustical testing for LTE and Voice over LTE using Agilent’s E6621A PXT wireless communications test set. Hermon Labs offers global compliance test solutions that include EMC, radio, product safety, environment and telecom.

Read More

Agilent and Bangor University celebrate £2 M investment in teaching lab for electronic engineering

November 06, 2012

Agilent Technologies Inc. and Bangor University opened a new Agilent-branded laboratory. The lab, located in the School of Electronic Engineering at Bangor University, is equipped with Agilent instruments and will support the teaching of undergraduate and postgraduate courses in electronic engineering.

Read More

Agilent introduces electrical redriver modeling solution

November 05, 2012

Agilent Technologies Inc. introduced a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.

Read More

Agilent to display test innovations at electronica

November 02, 2012

Agilent Technologies Inc. announced it will display its newest test innovations ranging from handheld analyzers to high-end X-Series instruments, including new 90000X and Q oscilloscopes, PXA spectrum analyzers and PNA-X network analyzers at electronica 2012 (Hall A1, Booth 506), in Munich, Nov. 13-16.

Read More

Agilent releases new software for X-Series signal analyzers

November 01, 2012

Agilent Technologies Inc. extended its leadership in 802.11ac WLAN test solutions with its latest measurement application release for X-Series signal analyzers.

Read More

Agilent and the University of Leeds open terahertz measurement research lab

October 30, 2012

Agilent Technologies Inc. announced the opening, at the University of Leeds, of the first Agilent-equipped terahertz measurement laboratory in Europe. The new laboratory will enable research on devices, components, circuits and systems at much higher frequencies than any other institution in the region has been able to do before.

Read More

Agilent expands capabilities of handheld spectrum analyzers for enhanced in-field use

October 29, 2012

Agilent Technologies Inc. announced expanded capabilities for the N934x C family of rugged handheld spectrum analyzers. The additional features give the HSA enhanced versatility for in-field applications like instrument remote control and peak power measurement of pulsed signals.

Read More

Agilent application note: Increase phased array antenna test throughput with Agilent digitizer

October 26, 2012

What: This application note addresses test challenges faced by phased array antenna engineers including:

  • The need for fast wideband, high resolution sampling of IF signals post downconversion.
Read More

Agilent announces webcast series on calibration service of test and measurement equipment

October 25, 2012

Agilent Technologies Inc. announced the webcast, “Calibration: Why It Matters and What It Should Include,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI. The webcast will be held Nov. 8.

Read More

Agilent to demonstrate newest 3-D EM software release at EuMW

October 24, 2012

Agilent Technologies Inc. announced that EMPro 2012 will be demonstrated at European Microwave Week (Booth 114), Oct. 29-Nov. 1, RAI, Amsterdam.

Read More

Agilent launches myAgilent personalized web portal for electronic measurement

October 23, 2012

Agilent Technologies Inc. announced the launch of a new web portal that allows customers to manage their relationship with Agilent and receive information personalized to their interests and the products they own.

Read More

Agilent to demonstrate newest microwave and RF design and test solutions at EuMW

October 18, 2012

Agilent Technologies Inc. announced it will show its newest microwave and RF design, test and measurement solutions for the aerospace, defense, research, education, communications, transportation and medical markets at European Microwave Week (Booth 114), Oct. 29- 31, at the RAI convention center in Amsterdam.

Read More

Agilent to demonstrate LTE and WLAN test and measurement solutions at 4G World

October 15, 2012

Agilent Technologies Inc. announced it will demonstrate its newest LTE and WLAN test and measurement solutions, which cover the global technology and applications ecosystem for next-generation mobile broadband networks, at 4G World (Booth 322), McCormick Place West,  in Chicago, Oct. 30-31.

Read More

Agilent continues to enhance connectivity software for electronic test instruments

October 11, 2012

Agilent Technologies Inc. announced the latest release of its IO Libraries Suite 16.3 software for use with electronic test instruments. The new release continues to improve the customer experience, with support for Microsoft® Windows 8 and Windows Server 2012 as well as enhanced USB connections.

Read More

Agilent to demonstrate automotive functional test system at expo

October 10, 2012

Agilent Technologies Inc. will feature the PXI-based TS-8900 Automotive Functional Test System at the Automotive Testing Expo (Booth 12024), Oct. 23-25, at the Suburban Collection Showplace in Novi, Mich.

Read More

Agilent introduces 14 FieldFox handheld analyzers that deliver benchtop accuracy

October 09, 2012

Agilent Technologies Inc. announced 14 FieldFox handheld analyzers that deliver benchtop-instrument accuracy in field-test environments. Designed for harsh conditions and hard-to-reach locations, FieldFox analyzers cover satellite communications, microwave backhaul, military communications, radar systems and a wide range of additional applications.

Read More

Agilent 3-D EM simulation software selected by STMicroelectronics for ESD development

October 05, 2012

Agilent Technologies Inc. announced that STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, has selected Agilent’s Electromagnetic Professional (EMPro) software for use in development of ESD structures based on advanced CMOS process technology.

Read More

Agilent announces free 4 M memory upgrade for 16800 series portable logic analyzers

October 04, 2012

Agilent Technologies announces its free 4 M memory upgrade promotion for the company’s popular general purpose 16800 series logic analyzer. For a limited time only, customers who purchase any 16800 series portable logic analyzer can get the 4 M upgrade to achieve greater design insight with deeper memory at no additional cost. 

Read More

Agilent unveils ADS 2012

October 03, 2012

Agilent Technologies Inc.  unveiled ADS 2012, the next major release of its Advanced Design System (ADS) flagship RF and microwave EDA platform.

Read More

Agilent 3-D EM simulation software selected by STMicro for ESD development

October 03, 2012

Agilent Technologies Inc. announced that STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, has selected Agilent’s Electromagnetic Professional (EMPro) software for use in development of ESD structures based on advanced CMOS process technology.

Read More

Agilent enables Galileo testing with GNSS signal creation software

October 02, 2012

Agilent Technologies Inc. announced that its Signal Studio for Global Navigation Satellite Systems (GNSS) software (N7609B) has been enhanced with real-time and basic mode capabilities designed to allow engineers to simulate Galileo signals for receiver testing and to address the needs of the manufacturing test market.

Read More

Agilent offers 3 application notes on techniques for precise field measurements

September 26, 2012

Agilent Technologies is offering three application notes covering interference measurements, cable and antenna measurements, and measurement calibrations:

Read More

Agilent delivers application note and PXI test systems webcast

September 25, 2012

Often when configuring PXI test systems the selection of components involves multiple suppliers, consequently interoperability is a concern.  The Interoperability of PXI based Test Systems application note and webcast show how to build a multi-vendor PXI system to ensure a smooth implementation of the PXI hardware & software components.

Read More

Agilent congratulates team at CERN for measuring what many thought immeasurable

September 18, 2012

Agilent Technologies Inc. offers its congratulations to the team at the European Organization for Nuclear Research, more commonly known as CERN, for discovering — at 99.9999 percent confidence — what is almost certainly the long-sought Higgs boson, an elementary particle that had been predicted to exist for theoretical reasons. Agilent is proud to have provided technology that played a part in this landmark discovery.

Read More

Agilent to launch seminar tour focused on principles of system design for automated testing

September 17, 2012

Agilent Technologies Inc. announced it will launch a seminar tour on system design principles, including on-site demonstrations, case studies and expert insight into how to develop high-capacity and high-performance electronic test systems. At these complimentary full-day technical seminars, Agilent experts and leading system integrators will cover the latest technologies for automated instrumentation in a broad set of industries.

Read More

Agilent and CATR (TMC) to collaborate on TD-LTE MIMO

September 14, 2012

Agilent Technologies Inc. announced a memorandum of understanding has been signed with the China Academy of Telecommunication Research (Telecommunication Metrology Center), or CATR (TMC). The two organizations have agreed to work together on TD-LTE MIMO over-the-air (OTA) test research.

Read More

Agilent launches webcasts series on new FieldFox handheld analyzers

September 13, 2012

The series of application-focused webcasts instruct to make precise RF and microwave measurements with the new FieldFox family of microwave analyzers. Test results are comparable to that of benchtop equipment in the lab as well as field installation and maintenance environments. Topics include techniques for precise interference measurements, cable and antenna measurements, calibration and alignment measurements, time domain measurements and precise power measurements.

Read More

Agilent Technologies announces hardware upgrade for ENA Network Analyzers

September 12, 2012

Agilent Technologies Inc. announced the latest upgrade of the company’s E5071C ENA series network analyzer’s digital hardware, with no price increase. The measurement cycle time of the new hardware is two times faster than that of any other competitive RF network analyzer.

Read More

Agilent introduces methodology to accelerate large-scale active antenna calibration and testing

September 11, 2012

Agilent Technologies Inc. introduced the industry’s widest-bandwidth real-time digital downconverter option on the M9703A AXIe eight-channel high-speed digitizer. The new DDC functionality enables faster, more flexible measurements in high-channel-count applications.

Read More

Agilent to demo test and measurement solutions in coherent communication at ECOC

September 10, 2012

Agilent Technologies Inc. announced that it will demonstrate test and measurement solutions in coherent communication at ECOC (Amsterdam RAI, Hall 1, Stand 712) in Amsterdam, Sept. 17-19.

Read More

Agilent, Concilium, University of Pretoria join forces to create computer-aided education center

September 06, 2012

Agilent Technologies Inc. announced that it has worked with Concilium Technologies and the department of electrical, electronic and computer engineering at the University of Pretoria, South Africa, to develop one of the largest electrical engineering training laboratories in the world.

Read More

Agilent introduces world’s fastest PXI vector signal generator

September 05, 2012

Agilent M9381AAgilent Technologies Inc. introduced the world’s fastest vector signal generator in a PXI form factor. The Agilent M9381A is a 1-MHz to 3- or 6-GHz VSG that combines fast switching and excellent RF parametric performance.

Read More

Agilent demonstrates its newest solutions for ATE at AUTOTESTCON

September 05, 2012

Agilent Technologies Inc. announced it will present a wide range of recently introduced ATE instruments and software at AUTOTESTCON 2012 (Booth 513). The show runs Sept. 11-13 at the Disneyland Resort in Anaheim, CA.

Read More

Agilent introduces 14 FieldFox handheld analyzers that deliver benchtop accuracy

September 04, 2012

Agilent Technologies Inc. announced 14 FieldFox handheld analyzers that deliver benchtop-instrument accuracy in field-test environments. Designed for harsh conditions and hard-to-reach locations, FieldFox analyzers cover satellite communications, microwave backhaul, military communications, radar systems and a wide range of additional applications.

Read More

Agilent Technologies releases new high speed digital poster

August 31, 2012

Achieve your best design with the new Agilent High Speed Digital Solutions poster. The FREE poster is designed togive information about achieving signal integrity in high speed digital design, offering a greater understanding of the technologies with a full range of design and test solutions.

Read More

Agilent Technologies and China Mobile agree to collaborate

August 23, 2012

Agilent Technologies Inc. announced an agreement to collaborate with China Mobile Communications Co. Ltd. Research Institute (CMRI). China Mobile is the world’s largest mobile network operator and a market leader in 3G and next-generation wireless network development.

Read More

Agilent introduces family of waveform generators with unrivaled signal accuracy

August 21, 2012

Agilent Technologies Inc. introduced the 33500B Series waveform generators. The eight new one- and two-channel models, which generate waveforms up to 30 MHz, incorporate exclusive Trueform signal-generation technology. Trueform enables these models to offer unmatched capabilities for generating a full range of signals for the most demanding measurements required when designing electronic devices.

Read More

Agilent accredited as 1st non-government designated calibration agency under Japan Radio Law

August 13, 2012

Agilent Technologies Inc. announced that the company has been accredited as a designated calibration agency under Japan Radio Law by the Minister of Internal Affairs and Communications. Agilent is the first non-government designated calibration agency in Japan.

Read More

Agilent introduces high-bandwidth accessories for more durable oscilloscope probing

August 09, 2012

Agilent Technologies Inc. introduced economical semipermanent solder-in probing solutions for its InfiniiMax III oscilloscope probing system. Engineers can use these accessories forhigh-speed digital system design, component design/characterization and differential serial bus measurements.

Read More

Agilent completes acquisition of AT4 Wireless Test Systems

August 03, 2012

Agilent Technologies Inc. announced that AT4 Wireless Test Systems’ business assets are now part of Agilent. The two companies had announced an acquisition agreement on July 16. Financial details were not disclosed.

Read More

Agilent Technologies announces wireless communications test set

August 01, 2012
p> Agilent Technologies Inc. introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

Read More

Agilent provides new application note on voice over LTE

July 31, 2012

The Agilent Power of X application notes provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments. The new “Solutions for Enabling Fast, Accurate and Efficient Testing of Voice Quality in LTE User Equipment (UE)” 5991-0794EN, available now, offers information into how to best address the long list of test requirements when testing the voice quality of LTE UE with the right VoIP test building blocks.

Read More

Agilent Technologies signs agreement to acquire AT4 wireless

July 23, 2012

Agilent Technologies Inc. and AT4 wireless announced that they have signed a definitive agreement for Agilent to acquire the assets of AT4 wireless' Test Systems business. Privately held AT4 wireless, based in Malaga, Spain, is a global provider of testing services and solutions for wireless communications.

Read More

Agilent introduces software for the DCA-X oscilloscope

June 29, 2012

N1012A OIF CEI 3.0 Compliance Test Application for 86100D DCA-XAgilent Technologies Inc. introduced two new test applications that leverage the high bandwidth and low jitter performance of  the Infiniium 86100D DCA-X oscilloscope.

Read More

Agilent announces winners of ‘Test of Time’ power-supply contest

June 26, 2012

Agilent Technologies Inc. announced the two grand prize winners of its Test of Time power-supply contest: Richard Factor of Little Ferry, N.J., and Simon Jensen of Husum, Germany. Each will receive an Agilent N6705B DC power analyzer and three modules.

Read More

Agilent collaborates with Thales to apply X-parameters* to RF system design

June 21, 2012

Agilent Technologies Inc. announced that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications

Read More

Agilent Technologies announces industry’s first true USB coaxial switch

June 19, 2012

Agilent Technologies Inc. announced a USB-powered, single-pole double-throw coaxial switch, operating from DC to 18 GHz. The first-to-market microwave switch driven by a USB port, the Agilent U1810B will provide system-design and manufacturing engineers a long-operating-life solution with convenient RF switching.

Read More

Agilent Technologies introduces world’s fastest USB power sensors

June 19, 2012

Agilent Technologies Inc. announced the Agilent U2020 X-series, the world’s fastest USB power sensors. With the peak and average power measurement capabilities of a power meter, these compact high-performance sensors allow engineers to test devices faster and with greater efficiency and accuracy.

Read More

Agilent debuts breakthroughs in PA design for next release of ADS

June 14, 2012

Agilent Technologies Inc. unveiled new technologies and breakthroughs for RF power amplifier design. These capabilities and more will be part of the next major release of Agilent’s flagship Advanced Design System.

Read More

Agilent introduces highest performance mid-range vector network analyzer

June 13, 2012

Agilent Technologies Inc. introduced five new PNA-L vector network analyzer models, offering design and manufacturing engineers the highest performance (up to 50 GHz) in a mid-range VNA, along with lower cost and future-proof capabilities.

Read More

Agilent accelerates early wireless design verification with new SystemVue release

June 06, 2012

Agilent Technologies Inc. announced a new release of SystemVue, Agilent’s premier platform for designing communications systems.

Read More

Agilent's newest GoldenGate software release accelerates design verification

June 05, 2012

Agilent GoldenGate, Reproduced with Permission, Courtesy of Agilent Technologies Inc.Agilent Technologies Inc. announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.

Read More

Agilent introduces lower-priced, yet powerful oscilloscopes

May 31, 2012

Agilent Technologies Inc. introduced the 1000B Series oscilloscopes. The four new two-channel models, with bandwidths from 50 MHz to 150 MHz, offer powerful capabilities at an attractive price for engineers, technicians and educators.

Read More

Agilent's Bluetooth RF test solution speeds development of devices based on TI ICs

May 30, 2012

Agilent Technologies Inc. announced its Bluetooth low-energy test solution on the N4010A wireless connectivity test set was verified by Texas Instruments Inc. for use with TI’s integrated circuits in Bluetooth Smart and Smart-Ready devices. The Bluetooth low-energy Tx/Rx test capability on N4010A gives manufacturers and design houses reliable and efficient test solutions for single-mode and dual-mode devices.

Read More

Agilent Technologies introduces CAN eye-diagram mask testing on InfiniiVision X-Series oscilloscopes

May 25, 2012

Agilent Technologies Inc. introduced the oscilloscope industry’s first eye-diagram mask testing capability for the differential Controller Area Network serial bus. The CAN serial bus is used extensively for control and sensor monitoring in automotive applications as well as a broad range of industrial and medical equipment applications.

Read More

Agilent Technologies announces shipment of the IC-CAP 2012 platform for device characterization and modeling

May 18, 2012

Agilent Technologies Inc. announced shipment of the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP).

Read More

Agilent Technologies’ ADS selected by ADATA

May 15, 2012

Agilent ADSAgilent Technologies announced that ADATA Technology has selected Agilent’s Advanced Design System software for developing memory modules for the high-speed digital market.

Read More

Agilent announces voice-over-LTE test system developed with Brüel & Kjær

May 11, 2012

Agilent Technologies Inc. announced that the Agilent PXT wireless communications test set is now available for testing voice quality on Voice-over-LTE (VoLTE) 4G phones with the Brüel & Kjær PULSE Audio Analyzer and Head and Torso Simulator (HATS).

Read More

Agilent announces new A&D application videos

May 07, 2012

Agilent A&D videosAgilent Technologies introduces new A&D application videos. The 1-3 min videos provide information on interference mitigation, switch repeatability and a new tool for instrument control.

Read More

Agilent offers new 802.11ad PHY layer testing application note

May 07, 2012

The new application note “Solutions for 802.11ad PHY Layer Testing” offers insight into how to enable quick and accurate simulation, generation and analysis of 60 GHz signals with 2 GHz modulation bandwidth.

Read More

Agilent Technologies introduces 6 GHz signal generators with industry-best performance

May 03, 2012
Agilent Technologies Inc. announced four new X-Series signal generators that provide unmatched performance in phase noise, output power, ACPR, EVM and bandwidth. With these capabilities, Agilent’s new MXG and EXG products (available in analog and vector models) support the development of components and receivers that meet the complex challenges of mitigating interference, speeding data throughput and increasing signal quality in applications such as radar, military communications and consumer wireless. Read More

Agilent Technologies enhances FieldFox RF analyzers

May 03, 2012

Agilent Technologies Inc. enhanced its FieldFox RF analyzers with options for time-domain analysis and channel-power measurements. These options give engineers the features they need to more easily and quickly test their RF communications infrastructure.

Read More

Agilent announces cost-effective millimeter-wave signal analysis solution

May 02, 2012

Agilent Technologies Inc. announced that its EXA signal analyzer is now the industry's most cost-effective millimeter-wave signal analyzer, covering frequencies up to 44 GHz. With external mixing, it can cover up to 325 GHz. The result is easier, more accurate millimeter-wave measurements.

Read More

Agilent will acquire Centellax’s test and measurement business

May 01, 2012

Agilent Technologies Inc. and Centellax announced they have signed a definitive agreement for Agilent to acquire the assets of Centellax’s test and measurement business. Centellax, a privately held company, designs and manufactures key technology and products such as bit-error ratio testers and signal generators used for testing high-speed digital communication systems and components.

Read More

Agilent Technologies offers new video on TD-LTE beamforming

April 30, 2012

The Agilent video “Verify and Visualize your TD-LTE Beamforming Signals” demonstratesthe Agilent N7100 Multi-Channel Signal Analyzer, 89600 VSA Software TD-LTE Beamforming MIMO 8-channel measurement solution.

Read More

Agilent Technologies offers new app note on testing 802.11ac signals

April 27, 2012

The new “Testing Very High Throughput 802.11ac Signals” application note offers insight into how to achieve quick and accurate generation and analysis of wider bandwidth 802.11ac signals.

Read More

Agilent's Advanced Design System selected by Comtech EF Data

April 26, 2012

Agilent_Advanced Design SystemAgilent Technologies Inc. announced that Comtech EF Data has selected ADS software for use in developing RF and microwave circuits for high-performance satellite communications systems.

Read More

Agilent to demo new test solutions at CTIA

April 24, 2012

Agilent Technologies Inc. will demonstrate its high-performance test and measurement solutions at the CTIA Wireless show, May 8-10, at the Ernest N. Morial Convention Center (Booth 3935) in New Orleans. The company’s new solutions provide greater insight into devices being designed and tested, accelerating the development of the latest wireless technologies, including LTE, LTE-Advanced, GNSS, DC-HSDPA, 802.11ac WLAN and femtocells.

Read More

Agilent launches new high-speed digital videos page

April 20, 2012

Achieve your best design with the new 24/7 Agilent High-Speed Digital (HSD) videos page. The site is designed to give more information about the intricacies of high-speed digital design from Agilent, and much more.

Read More

Agilent offers advanced PC-based oscilloscope analysis application

April 17, 2012

Agilent N8900AAgilent announced the industry’s most advanced PC-based oscilloscope analysis software, which allows engineers to analyze previously captured signals from oscilloscopes made by Agilent and other vendors.

Read More

Agilent Technologies announces new radar and EW measurement application brief

April 16, 2012

The application brief, “Using Time Sidelobe Measurements to Assess the Performance of Compressed-Pulse Radars”  defines key problems related to measurements of compressed-pulse radars, describes the time sidelobe method, and outlines the practical uses of this approach.

Read More

Agilent Technologies, ETS-Lindgren host CTIA Wireless MIMO OTA educational panel discussion

April 05, 2012

Agilent Technologies Inc. announced its participation, with ETS-Lindgren, in an educational panel discussion – “MIMO OTA Measurements: The Next Generation Platform for Wireless Testing” – at the International CTIA Wireless event in New Orleans.

Read More

Agilent introduces industry’s widest-bandwidth MIMO PXI vector signal analyzer

April 03, 2012

Agilent Technologies Inc. announced the availability of a wideband MIMO PXI vector signal analyzer that delivers the industry’s highest-bandwidth signal analysis. The new analyzer enables R&D and test engineers to validate their MIMO 802.11ac designs with a unique combination of accuracy, speed, bandwidth and scalability in a small form factor.

Read More

Agilent Technologies announces new videos on cellular testing

March 13, 2012

Agilent announces two new videos, “MIPI M-PHY Automated Tx Test Demo” and “Anticipate Multi-Standard Radio (MSR) Performance with Agilent SystemVue”, created to help understand the intricacies of the evolving cellular standards to enable faster delivery of  products to market. 

Read More

Agilent's SystemVue Software Selected by Télécom ParisTech

March 02, 2012

AgilentSystemVueAgilent Technologies Inc. announced that Télécom ParisTech has selected the company’s SystemVue software for use in analog and mixed integrated systems research.

Read More

Agilent introduces add-in extensions for compliance application software

January 26, 2012
Agilent Technologies Inc. announced a product enhancement designed to help engineers extend the capabilities of compliance applications on the company’s Infiniium real-time oscilloscopes.

Read More

Agilent introduces seven high-power modules for modular power system

January 23, 2012
Agilent Technologies Inc. introduced seven high-power modules for its popular N6700 modular power system. Read More

Agilent delivers high-speed inter-chip compliance test software

January 11, 2012

Agilent Technologies Inc. announced the release of the first commercially available High-Speed Inter-Chip (HSIC) compliance test software for real-time oscilloscopes. The software automatically tests HSIC signals according to HSIC specifications.

Read More

Agilent introduces handheld oscilloscopes with advanced displays

January 11, 2012

Agilent_handheldAgilent Technologies Inc. announced the addition of two new oscilloscopes to its portfolio of handheld instruments. The 100 MHz U1610A and 200 MHz U1620A - the first handheld units to include a color VGA display.

Read More

Agilent Technologies Introduces Industry-First, Phase Noise/Spectral Jitter Analysis for Digital Communications Analyzer

January 22, 2007
New Modules, Software Enable Advanced Device Characterization and Signal Integrity Insight for High-Speed Digital Designers, Manufacturers Read More

Articles

Synthetic Instrumentation: The Future of Test

March 14, 2013
Experts from National Instruments, Agilent Technologies and Aeroflex weigh in on the future of RF/microwave test and measurement instrumentation. Read More

Nurturing Design Innovation for China's Future

January 29, 2013
Discusses how design innovation will be critical to China's ongoing industrial and economic development, and how EDI CON 2013 will provide the solutions and technology necessary to encourage design and development Read More

Full Transmitter Linearization Using a Wideband DPD Measurement Platform

January 15, 2013

Examines how to enable full RF transmitter linearization using a wideband DPD measurement platform that eliminates the shortcomings of more traditional methods

Read More

Agilent application note: Concepts and measurements of HSPA+ evolution

November 16, 2012

What: The new application note, “Concepts and Measurements of HSPA+ Evolution” explains what’s new in HSPA+, technical details and operations, new requirements for HSPA+ 3GPP Release 7 & 8, new design and test products for HSPA+, including  manufacturing test.

Read More

Toward Full Coverage Voice Over LTE

November 14, 2012

Addresses new challenges and the importance of ensuring VoLTE delivers the standard of voice call the network operators want to provide, and how it will require developers and operators to increase focus on testing real-world performance

Read More

Accelerating the Response to RF Interference

October 15, 2012

In-depth look at intentional interference and the ultimate goal of countering undesired signals

Read More

Agilent to demonstrate next-gen test and measurement solutions at AOC

September 25, 2012

Agilent Technologies Inc. announced it will demonstrate next-generation test and measurement solutions that are enabling electronic warfare including radar, satellite, signal generation and analysis, and in-field RF and microwave at AOC, (Phoenix Convention Center, Booth 225) in Phoenix, Sepember 23-26.

Read More

The Ins and Outs of Microwave Signal Capture and Playback

August 14, 2012

Discusses what is needed for streaming and capture and playback of microwave signals and how the industry is beginning to implement the needed architectural features to accomplish it

Read More

Testing Radar and EW Systems for the Real-World

July 12, 2012

Presents a combination of COTS instrumentation and EDA software for testing radar and EW systems

Read More

Techniques for Time Sidelobe Measurements with Pulse Compression Radar

June 14, 2012

Provides set up and measurement tips for time sidelobe measurements with pulse compression radar

Read More

Signal Generators Provide Perfect and Precisely Imperfect Signals

May 15, 2012
Introduction to the new X-Series of signal generators that are available in analog and vector modulation models, from the pure and precise MXG to the cost-effective EXG Read More

Techniques for Improving Noise and Spurious in PLLs

May 15, 2012

Features techniques and how using the right design and modeling approaches creates multi-loop PLLs to efficiently deliver the performance needed for demanding applications

Read More

Why Engineers Ignore Cable Loss

March 15, 2012

Highlights an article covering cable loss and how to adjust for it

Read More

Tackling MIMO Design and Test Challenges for 802.11ac WLAN

March 11, 2012

Details how system simulation will help understand the design performance and requirements needed to achieve transmitter system-level metrics

Read More

LTE-Advanced Physical Layer Design and Test Challenges: Carrier Aggregation

November 01, 2011
Achieving the ITU's IMT-Advanced 4G target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink requires bandwidths that are wider than the maximum 20 MHz bandwidth specified in 3GPP Release 8/9 LTE. To achieve those targets, 3GPP Release 10 LTE-Advanced supports carrier aggregation,... Read More

Creating a Radar Threat Simulator and Receiver Calibrator with Precise Angle of Arrival

August 11, 2011
Accurate simulations of radar and MIMO signals. Read More

Events

5/29/13

Multi-antenna Array Measurements Using Digitizers

Agilent Technologies
Agilent in Aerospace/Defense - Webcast Series

Read More
6/12/13

LTE Design and Test Challenges for Public Safety Radio and SDR Applications

Agilent Technologies
Agilent in Aerospace/Defense - Webcast Series

Read More
5/23/13

Your LTE Devices Need to Pass Conformance Tests - Now What?

Agilent Technologies
Agilent in LTE & Wireless - Webcast Series 2013

Read More
4/25/13

8x8 MIMO and Carrier Aggregation Test Challenges for LTE

Agilent Technologies
Agilent in LTE & Wireless - Webcast Series

Read More
4/18/13

Reflections of the Future: Trends in Radar and their Impact on Test

Agilent Technologies
Agilent in Aerospace/Defense - Webcast Series

Read More
3/27/13

Techniques for Precise Power Measurements in the Field

Agilent Technologies
FieldFox Handheld Analyzers Education Series

Read More
3/13/13

Signal Analyzer Fundamentals and New Applications

Agilent Technologies
RF and Microwave Education Series

Read More
2/27/13

World's Fastest Antenna Performance Measurement Technique

Agilent Technologies
Innovations in Network Analysis Webcast Series

Read More
2/26/13

NFC Test Challenges for Mobile Device Developers

Agilent Technologies
Agilent in Wireless Communications Webcast Series

Read More
2/21/13

Electronic Warfare Testing: Capture, Meas. & Emulation

Agilent Technologies
Agilent in Aerospace/Defense - Webcast Series

Read More
1/30/13

Signal Generator Fundamentals and New Applications

Agilent Technologies
RF and Microwave Education Series

Read More
1/24/13

Moving Forward to LTE-Advanced with Heterogeneous Networks

Agilent Technologies
Agilent in Wireless Communications Webcast Series

Read More
1/23/13

Techniques for Precise Time Domain Meas. in the Field

Agilent Technologies
FieldFox Handheld Analyzers Education Series

Read More
1/17/13

RF/uW Measurement Uncertainty: Calculate, Characterize, Minimize

Agilent Technologies
Agilent in Aerospace/Defense - Webcast Series

Read More
12/13/12

Envelope Tracking Simulation and Analysis


Agilent Technologies
Innovations in EDA Webcast

Read More
11/28/12

Calibration and Alignment Techniques for Precise Field Measurements

Agilent Technologies
FieldFox Handheld Analyzers Education Series

Read More

Downloads

How to measure 5-nanosecond rise/fall time in pulsed power amplifiers

Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Download

Creating a Solution for Testing Frequency-Hopping Spread Spectrum Devices

Wide bandwidth, high resolution AWGs
Measurement needs have driven the development of high-bandwidth AWGs, but they lacked accuracy and high resolution. Until now, AWG technology forced serious trade-offs between either high resolution or wide bandwidth. With the new Agilent M8190A 12 GSa/s arbitrary waveform generator, you will get both in one instrument!

Download

Solutions for LTE-Advanced Physical Layer Design and Test

LTE-Advanced (LTE-A) is an emerging mobile communications standard that boasts a number of significant benefits, including the ability to take advantage of advanced topology networks and achieve target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink. This white paper covers using signal generation and analysis to overcome challenges associated with carrier aggregation.

Download

Your request will be e-mailed directly to the company who will follow up with the requested information. This request is for legitimate sales inquires only – please do not submit promotions, solicitations or spam.

Back to Listings

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up