What:  At the 2025 IEEE MTT-S International Microwave Symposium (IMS), Keysight Technologies’ RF and Microwave experts will showcase solutions designed to drive spectrum innovations to optimize 5G networks and pioneer 6G technologies. With an end-to-end portfolio of product development solutions that quickly solve design, emulation and test challenges, Keysight is reducing risk and speeding time-to-market for satellite, IoT networks, massive MIMO antennas and 6G technology.

When: June 15 – 20, 2025

Where: Keysight Booth #743, Moscone Convention Center,  San Francisco, Calif.

Media: Contact Andrea Mueller to schedule media briefings and solution demonstrations.

Keysight will present the following demos that are accelerating RF and Microwave innovation:

  • Next-Generation RF Circuit Simulation and Optimization – RF Circuit Simulation Professional provides a unified, cross-platform environment that streamlines the entire design workflow, empowering engineers to comprehensively characterize multi-domain performance and achieve first-pass success through seamless co-simulation and optimization across different design platforms, mitigating costly and time-consuming redesign cycles.
  • 3D Heterogeneous Integration (3DHI) RF Module Integration and Simulation – Advanced Design System (ADS) 2025 enables drag-and-drop convenience for assembling silicon RFIC, III-V MMIC, packaging and PCB into a 3DHI RF module. It replaces these four disconnected design flows with one efficient multi-technology workflow
  • D-Band RFIC Analysis features record-breaking high-power full-duplex D-band links developed by NOKIA Bell Labs. This non-over-the-air (OTA) demo showcases IQNC technology at D-band, which effectively eliminates additive noise in receiver hardware, including CCD, for unmatched signal quality.
  • Basic Network Analysis to Complex Characterizations (PNA-X Pro) showcases the versatility of Keysight’s VNA instrument portfolio to meet diverse customer needs, including portable VNA models, high-performance benchtop PNAX-Pro models and production form factor models.
  • Phase Noise Test demonstrates advanced phase noise testing techniques that deliver the sensitivity and frequency coverage needed for today’s high-performance RF and mmWave systems.

Featured Talks with Keysight Experts:

  • State-of-the-Art Microwave Device Modeling Enabled by Artificial Intelligence and Machine Learning, Jianjun Xu, Machine Learning Engineer, Keysight
    • June 15 – 8 a.m. – 11:50 a.m.
    • Room #103, Moscone Convention Center
  • Automating Microwave Design: Challenges and Solutions, Matthew Ozalas, Senior Application Development Engineer & Scientist, Keysight; Charles Baylis and Robert J. Marks, Baylor University; Linda Katehi and Jian Tao, Texas A&M University; Zoya Popović and Stefan Stroessner, University of Colorado Boulder and Peng Wen Wong, FILPAL
    • June 15 – 1:30 p.m. – 5:20 p.m. 
    • Room #203, Moscone Convention Center
  • The RF/Microwave Signal Chain, Network Characteristics, Analysis and Measurement, Joanne Mistler, Solutions Engineer, Keysight
    • June 16 – 8:30 a.m. – 9:30 a.m.
    • Room #212, Moscone Convention Center
  • 3D Heterogeneous Integration Solutions for Design of Phased Array Systems, Dr. Ian Rippke, Director Global Software Solutions, Keysight; Nate Altaffer, Solutions Engineer and Edward Horne, Director, Systems Engineering, 3D Glass Solutions
    • June 17 – 10:10 a.m. – 11:50 a.m.
    • Room #206, Moscone Convention Center
  • 300-GHz-Band InP HBT Power Amplifier Module Enabling 280-Gbps 0-dBm Signal Generation with Digital Predistortion, Sam Kusano, Application Development Engineer, Keysight
    • June 19 – 10:30 a.m. – 10:50 a.m.
    • Room #211, Moscone Convention Center