White Papers

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Designing BUC/SSPAs for Airborne Applications

As we witness the evolution of integrated communication, we also observe the increased number of requirements for airborne microwave transmission, ranging from satellite to air-to-ground CDL band communications. Airborne applications introduce many challenging design constraints including increased temperature ranges, thermal management, vibration and shock, EMC/EMI, power requirements, and safety, all while maintaining portability as a key factor.

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RF/Microwave Technology Driving the Connected Car

In-car networks and advanced driver-assist systems (ADAS) present many design challenges to engineers. This white paper looks at Cadence® AWR Design Environment® software solutions for RF to millimeter-wave (mmWave) front-end component development that address electronic product development for automotive applications.

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NewSpace Terminal Testing Challenges and Considerations

Today’s satellite communication systems combine features from legacy cellular networks and emerging wireless technologies. New constellations are under development that attempt to provide ubiquitous mobility and internet networks via satellites, ground stations and user terminals (Figure 1). Each link in the supply chain presents unique challenges for R&D, production and deployment for both the components and system development.

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Flying an Agile RF Transceiver in Space

ADI’s unique commercial space flow enables satellite bus and payload builders to integrate a modern solution rapidly that meets the specific needs of the newest generation of on-orbit space vehicles. Aside from the process, we’ll explain the rationale behind having two commercial space flows on the impacts on RF and Microwave products.

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Application Note: Improving R&S®FSWP Measurement Speed

For automated test applications, measurement time is often as important as the quality of the measurement. In practice, phase noise measurements are generally not considered fast, but test engineers still desire to save as much test time as possible. With this paper you get a modern, digital signal processing based, phase-noise test set that performs many tasks in parallel in an effort to improve measurement speed.

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3D Printed Dielectric Lenses Increase Antenna Gain and Widen Beam Scanning Angle

RF markets are demanding greater performance for wireless links and sensing applications. Active Antenna Systems are the incumbent solution, but come with high cost and complexity. This white paper demonstrates how polymer dielectric 3D printing is used to create higher performance RF devices that can reduce complexity and cost of RF systems.

Highly Integrated Transceiver with RF Front End Reduces Design Time and Development Resources

Richardson RFPD engineers and others have teamed with Analog Devices to introduce a highly-integrated transceiver and have built SoMs and RF front ends to interface with it. Our goal is to provide engineers with small, low-power, high-performance starting points that will reduce design time and the amount of needed resources.

Reliable and Flexible Simulation of Angle of Arrival (AoA)

Engineers often need to test the direction finding capabilities of radar warning receivers in the lab. A perfect solution is to use multiple coupled R&S®SMW200A vector signal generators that are phase-coherent and time-synchronized. This setup enables simulation of the angle of arrival (AoA) of radar signals in the lab.

A Comprehensive Way to Use Bonding to Improve RF Performance of Low Noise Amplifiers

Is RF engineering a form of black magic? This article analyzes the challenges faced in the development of ADH519S, an 18 GHz to 31 GHz low noise amplifier (LNA), for the aerospace market. The die used in the product development for space was originally released to the commercial industry in the LC4 package.

Smart Meters: Designing a Key Part of the Smart Grid Ecosystem

In this paper, TE Connectivity (TE) will examine smart meters—a key part of the smart grid ecosystem—and describe the market growth factors, technology trends, applications and features to consider.

Over-the-Air RF Conformance Measurements on 5G NR Devices

Want to discover antenna measurement key parameters and over-the-air (OTA) test methods and setups? Read this white paper to learn more on the technical background for OTA testing on 5G NR devices. Focusing on RF conformance aspects and UEs, the paper examines the requirements described in the technical specifications.

Solving RF Isolation Issues with RF Inductors

Many consumer products communicate over broadband networks. From television to fiber transmission networks, the bandwidth of data communication is increasing, and the integrity of RF signals has become a major concern. This paper demonstrates how inductors are used for RF isolation in circuits ranging from relatively narrow band applications like portable devices up to broadband networks for data distribution.

Ease Design For Deterministic Latency In UltraFast Digitizing Systems

Discover how ultra-fast data conversion and signal processing systems can be designed to guarantee deterministic latency. Past efforts focused on increasing data transmission speeds and bandwidths but increasingly, modern applications now set an equally high value on determinism. This article considers determinism, at device level and expands on the topic of how ultra-fast data conversion and signal processing systems can be designed to guarantee deterministic latency.

Accurate Noise Figure Measurement in ERZIA K/Ka-Band Low Noise Amplifiers for Satcom Applications

A discussion of noise figure measurements includes a wide number of options, instrumentation, and techniques each with their own advantages and limitations. In this tech brief, we focus on non-cryogenic applications, with proven performance, that can be conducted with standard laboratory equipment and easily followed by trained personnel.

Measurements on Devices with Very High Noise Figure

Measurements of very high noise figure components are performed for a number of reasons. For instance, in a wide range of applications, devices under test (DUT) are characterized within a complex test setup that includes high losses before or after the low noise DUT.