The design/construction of automated test equipment can significantly burden OEMs' engineering resources. This white paper discusses the critical challenges faced in RF and microwave tests and details three diverse build options and their corresponding pros and cons. It will help you understand the RF/Microwave strategy to ensure performance, scalability, and repeatability.

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The material presented in this PDF document is owned by the sponsoring company and Microwave Journal®. It is presented here to be downloaded by an individual for educational purposes. It may not be downloaded from this site and reposted elsewhere.

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