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The NI PXIe-5186 digitizer, co-developed by National Instruments and Tektronix, delivers a new level of performance in the small-form-factor, low-power PXI platform. Tektronix technology provides the trusted measurement fidelity of Tektronix oscilloscopes. The digital back end uses NI synchronization and memory core (SMC) technology to deliver high-data throughput at rates greater than 700 MB/s.
National Instruments announced the promotion of Eric Starkloff to senior vice president of marketing. Starkloff leads the organizations responsible for strategic planning, positioning the company’s innovative hardware and software platforms, marketing NI’s products and corporate brand, and creating an effective eBusiness platform.
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National Instruments announced 10 pieces of new application IP that enable engineers and scientists to use NI LabVIEW system design software to build their own custom RF instruments. This IP integrates with PXI FPGA targets such as the NI PXIe-5644R VST and extends their default capabilities.
National Instruments announced the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope.
National Instruments announced its acquisition of Dresden, Germany-based Signalion GmbH. The acquisition delivers strong wireless communications talent and technologies to the NI platform, which are critical to NI’s goal to continue to drive long term growth in the communications test industry.
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National Instruments released its Automated Test Outlook 2013 highlighting the company’s research into the latest test and measurement technologies and methodologies. The report examines trends affecting a variety of industries.
EDI CON 2013 (March 12-14, Beijing, China), the industry-driven event for RF, microwave and high speed digital electronic design announces the recent addition of several leading RFIC, component and material manufacturers, semiconductor foundries, EDA software and test equipment/solution providers as participants in the technical program and exhibition. As solution providers in high frequency electronic design and system integration, experts from these companies will offer attendees the latest information on the technology used in today’s communications and aerospace industries.
Read MoreIn-depth recollection of our current state for motivating wireless communications and sketches a vision of our 5G future
Read MoreThe MILCOM management and sponsors made a wise decision to cancel the event this year as most of the east coast was pretty much closed down from hurricane Sandy. Everyone I know in New England down to the Mid-Atlantic found out over the weekend that their flights were cancelled. It was a good move and addressed any safety concerns of people trying to get there. MILCOM even analyzed their attendee list and determined that approximately 40% of them would be affected by the storm so decided to cancel. I applaud them for taking this action and promoting it quickly to the attendees. Even though the show was cancelled, there was still a lot of company news and products that I received for the event so here is a summary of the show that did not happen from an RF/microwave perspective.
Read MoreDescription of a spectrum monitoring receiver optimized for over-the-air measurements
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Introduction to the vector signal transceiver that combines a vector signal analyzer, a vector signal generator and a high speed digital I/O
Eric Starkloff, Vice President of Marketing for Test and Embedded at National Instruments, talks about the company's development of new RF/microwave products and its push into the RF design realm via AWR's Microwave Office.

Technical Education Training Webcast Series
National Instruments is leading the way in providing more open and flexible measurement devices based on field-programmable gate array (FPGA) technology. Learn how you can use NI LabVIEW FPGA to design and customize your RF instrumentation, and discover the advantages software-designed instrumentation can provide in your test systems.
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DownloadThe modern breed of test engineers is already using intuitive new technologies to reduce space and decrease test and development time all in a reduced budget. National Instruments is helping test engineers address these challenges with user-programmable FPGA-based instrumentation. Learn more about the benefits of using an open field-programmable gate array (FPGA) for 802.11ac testing specifically.
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