This application note demonstrates a simulation-based methodology for broadband power amplifier (PA) design using load-line, load-pull, and real-frequency synthesis techniques. The design highlighted in this application note is a Class F amplifier created using the Qorvo 30 W gallium nitride (GaN) high electron mobility transistor (HEMT) T2G6003028-FL.Download
RF transmitters are an essential part of modern communications. Designed and assembled from core RF components, RF transmitters have many different forms and applications. We often think of RF transmitters in wireless communications, but the concept applies equally to wired applications such as cable television.Download
National Instruments is leading the way in providing more open and flexible measurement devices based on field-programmable gate array (FPGA) technology. Learn how you can use NI LabVIEW FPGA to design and customize your RF instrumentation, and discover the advantages software-designed instrumentation can provide in your test systems.
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Request your free copy of the NI RF and microwave poster, a comprehensive reference chart of the latest wireless standards, conversion tables, and formulas.
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The modern breed of test engineers is already using intuitive new technologies to reduce space and decrease test and development time all in a reduced budget. National Instruments is helping test engineers address these challenges with user-programmable FPGA-based instrumentation. Learn more about the benefits of using an open field-programmable gate array (FPGA) for 802.11ac testing specifically.
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Software-defined RF test system architectures have become increasingly popular over the past several decades. Almost every commercial off-the-shelf (COTS) automated RF test system today uses application software to communicate through a bus interface to the instrument. As RF applications become more complex, engineers are continuously challenged with the dilemma of increasing functionality without increasing test times, and ultimately test cost. While improvements in test measurement algorithms, bus speeds, and CPU speeds have reduced test times, further improvements are necessary to address the continued increase in the complexity of RF test applications.Download
National Instruments has redefined the traditional approach by combining PXI hardware and NI LabVIEW system design software, leveraging commercial technologies such as multicore microprocessors, user-programmable FPGAs, PCI Express hardware, and system design software to meet the flexibility and scalability demand for future high-frequency test and measurement applications.Download
This paper discusses the setup details for the demo shown in this video Head to Head: NI 5665 vs. Traditional Boxed Instruments. The demo compares the performance and speed of the NI PXIe-5665 with the Agilent PXA. Rather than comparing the datasheet specifications of both instruments, this video compares the two instruments while performing real- world test scenarios.Download
Signals intelligence describes a broad range of applications ranging from communications jamming to identification of interference or pirating signals. While this paper discusses many of the specific needs for each application, it primarily focuses on the techniques required to analyze intermittent or "bursty" RF signals.Download