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Articles by Anritsu Co.

Remote Spectrum Monitor: MS27101A

MS27101A Remote Spectrum MonitorAnritsu Company continues to expand its industry-leading field test portfolio with the introduction of the MS27101A Remote Spectrum Monitor. The most recent edition to Anritsu’s interference detecting tools, the MS27101A can be used with Anritsu’s Vision™ software to create a highly accurate remote solution for government regulators and university lab researchers to identify interference patterns as well as record spectrum history.


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Anritsu introduces ShockLine VNA solutions to lower test costs

Anritsu Co. introduces an E-band option for its ShockLine™ MS46500B series of 2- and 4-port performance Vector Network Analyzers (VNAs) that addresses the market need to lower cost-of-test for E-band components. With the option installed, the MS46500B series can reduce production costs and more efficiently verify the performance of high-frequency passive components, such as antennas, filters, and duplexers during manufacturing.


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Two Frequency Solutions to Shockline MS46500B Series

MS46500Anritsu is pleased to announce the addition of two frequency solutions to their Shockline MS46500B series of 2 and 4 port vector network analyzers (VNAs). The new models include a unique E-band option for testing and verifying the efficiency of passive components during manufacturing, and a high performing 20 and 40 GHz Microwave option.


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Anritsu names Innis VP/GM of Americas

Anritsu Co. announces the appointment of Paul Innis as vice president and general manager of the Americas Sales Region, incorporating the United States, Canada, Central and South Americas, as well as the Caribbean. Innis will use his extensive experience to successfully position Anritsu Co.’s wide portfolio of product and services into the telecommunications, general industry and government markets, as well as into emerging industries, such as connected cars and the rapidly growing Internet of Things (IoT).


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Anritsu adds dual wavelength measurement capability to O/E calibration modules

Anritsu Co. introduces two options for its MN4765B series of O/E calibration modules that help to create a highly accurate, flexible and cost-effective solution for the characterization of optoelectronic devices such as modulators, photoreceivers and integrated optical transceiver modules. With these new options, the MN4765B can be used with the MS4640B VectorStar® Vector Network Analyzer (VNA) family to perform optoelectronic measurements up to 70 GHz at both 1310 nm and 1550 nm wavelengths.


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ME7834LA Mobile Device Test Platform for 3CA Tests

ME7434 platformAnritsu Company announces support for LTE-A 3 Carrier Aggregation (3CA) Carrier Acceptance Test (CAT) requirements.  The ME7834LA is a scalable GCF, PTCRB, and carrier-validated test system that enables certification of 3G and LTE devices to industry and carrier standards. It provides test coverage for 3GPP 36.523 as well as a wide portfolio of CAT test plans across multiple operators. For existing users of the ME7834L platform, an upgrade path is available with support.


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Anritsu Co. introduces isotropic antennas to expand EMF measurement system capability

Anritsu Co. expands its Electromagnetic Field (EMF) Measurement System with the introduction of isotropic antennas that provide frequency coverage from 9 kHz to 6 GHz. Compatible with certain LMR Master™, Spectrum Master™, and Cell Master™ handheld analyzers, the new antennas support measurements of EMF radiation to ensure wireless networks are in compliance with various national standards for personal safety established by government regulatory authorities.


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Anritsu enhances O/E Modules for VectorStar VNA family

Anritsu Co. enhances its MN4765B series of O/E modules for the MS4640B VectorStar® Vector Network Analyzer (VNA) family that creates a cost-effective and flexible solution for measuring 56 Gb/s components and transceivers used in telecommunications and data communications applications. The MN4765B module, combined with the MS4640B VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currently used in R&D and manufacturing environments.


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