Anritsu Corporation and Orolia announce immediate support of assisted GPS (A-GPS) test functionality to meet 5G New Radio (NR) carrier acceptance testing (CAT) requirements for multiple North American operators on the Anritsu ME7834NR 5G Mobile Device Test Platform.
Anritsu Corporation announced that it has joined the O-RAN ALLIANCE, an industry organization for promoting open standards, AI, virtualization and interoperability of wireless access networks,
as a Contributor member.
Anritsu Corporation announced that the first EPS-FB Protocol Conformance test for 5G NR has been verified on the ME7834NR 5G NR Mobile Device Test Platform powered by the Qualcomm® Snapdragon™ X60 5G Modem-RF System.
Application development in the millimeter-wave (mmWave) frequencies for terrestrial communication, high-frequency device characterization, automotive radar, and other technologies is increasing. The challenge of testing and characterizing the devices that enable new solutions is becoming increasingly complex. As broadband testing over hundreds of gigahertz of bandwidth is subject to repeatability and accuracy deficits, researchers and engineers are demanding better broadband solutions that help to overcome these challenges and simplify mmWave testing.
Continual demand to accurately measure dielectric and magnetic properties of material is a common need and apparent in our everyday lives. There is a need to quantitatively characterize material properties at RF and microwave frequencies. Learn more about the use of vector network analyzers (VNAs) as flexible and versatile tools to accurately and quantitatively characterize material properties and showcase the broad applicability of the VNA as a tool to accurately do this at high frequencies. Learn techniques and applications of RF and microwave material measurements.
Anritsu Corporation announces that Huawei has endorsed Anritsu’s MT8870A high speed wireless test platform for its RF calibration and validation tests. The Universal Wireless Test Set provides support for the Hi2110 and Hi2115 NB-IoT chipsets.
Time Difference of Arrival (TDOA) is a technique for geo-locating RF sources. It requires three or more remote receivers (probes) capable of detecting the signal of interest. Each probe is synchronized in time to capture corresponding I/Q data blocks. Software shifts the time signature of each I/Q data set to find the difference in the arrival time at each probe.
Anritsu Company introduces the Universal Fixture Extraction (UFX) option for its VectorStar® vector network analyzers (VNAs) to provide signal integrity and on-wafer engineers with an increased range of on-wafer and fixture calibration choices, even when a full set of calibration standards is not available.
Anritsu Co.introduces cellular module test application (CMTA) software for its signaling testers MD8475A/B which provides test cases to dramatically simplify testing chipsets and automotive-related telematics modules used in connected car designs and implementation. Integrating the new CMTA test package with the MD8475A/B through Anritsu’s innovative SmartStudio GUI allows automotive manufacturers and suppliers to verify operation in various carrier environments.