Anritsu Company will highlight solutions and technologies to address testing requirements associated with emerging high frequency commercial and military/aerospace designs throughout IMS Microwave Week in San Diego. The global test solution provider will showcase its leadership through multiple speaking engagements, product innovations in its booth 547 and technology partnerships with fellow industry pace setters.

Product Innovations

Headlining the product innovations at IMS is Anritsu’s new 70 GHz Rubidium™ MG36271A RF/Microwave Signal Generator. Live demonstrations will be held of the signal generator integrated with Virginia Diodes, Inc. (VDI) frequency extender modules to create a sub-THz solution.  

Anritsu’s decades-long vector network analyzer (VNA) leadership will be on display at IMS. In the booth, demonstrations on broadband measurements to 220 GHz using the VectorStar™ ME7838G Broadband VNA system featuring mmWave modules from Anritsu and VDI will be conducted. The ShockLine™ ME7869A VNA, the world’s first distributed, fully reversing 2-port VNA solution with guaranteed performance to 43.5 GHz, will be shown, as well. It is unmatched for its ability to conduct path loss measurements in antenna chambers.

Industry-leading handheld solutions for efficient testing in the laboratory, manufacturing line and field also will be at IMS. The Spectrum Master™ MS276xA family of ultraportable USB spectrum analyzers provides continuous coverage to 170 GHz. For high frequency spectral analysis, the Field Master Pro™ MS2090A will showcase IQ capture and streaming options that enable comprehensive off-line processing and playback of IQ data.

Anritsu Thought Leadership Sessions and Presentations

Anritsu will also address emerging test challenges associated with high speed designs through a series of technical sessions.

Sunday, June 11 – Measurements of Phased Array Beamforming Dynamics and Transients at mmWave Frequencies – Jon Martens, Ph.D., Anritsu Engineering Fellow, will be presenting at workshop WSM: Advances in Microwave and mmWave Wideband Measurements for Radar and Communications Applications. He will explore possible measurement structures at mmWave frequencies, execution and uncertainty challenges and a sampling of beam behaviors. Such factors are considered when conducting studies of beam dynamics and are important during design and characterization of phased array systems.

Monday, June 12 – Correlation Methods and Noise Figure –  Dr. Martens will also be presenting at workshop WMD: Device Thermal Noise Metrology: Needs, Challenges and Opportunities.  His talk will explore possible levels of improvement, potential limiting factors and exemplify implementation approaches for single-ended noise measurements.

Monday, June 12 – Recent Advances in Low Phase Noise and High Stability Microwave Oscillators – Dr. Alexander Chenakin, Chief Technology Officer at Anritsu Company, will co-chair the workshop that will address low phase noise and high stability microwave oscillators. Various oscillator types, techniques, new materials, along with their main characteristics, will be reviewed.

Tuesday, June 13 – Advances in Microwave Synthesizer Technology – Dr. Chenakin will also present a keynote on advances in microwave synthesizer technology. He will present an overview of today’s microwave synthesizer technologies for test-and-measurement applications. The latest market demands, technology trends (including 6G), design challenges and various solutions will be discussed.

Tuesday, June 13 – Broadband On-wafer Differential VNA Measurements to 220 GHz: Concepts and Solutions – Product Marketing Manager Navneet Kataria will discuss key parameters of the VectorStar ME7838G Broadband System and MPI differential probes that enable true differential measurement to 220 GHz. Important aspects of the broadband system will be presented, as will overcoming on-wafer measurement concerns to obtain calibration and measurement optimization.

Wednesday, June 14 – 6G Devices, Applications and Related Measurements Challenges – Navneet Kataria will also present various 6G applications and how 6G devices are being measured with modern day instrumentation. As frequencies rise and the size of devices on-wafer become smaller, making accurate and precise measurements is more challenging, especially in the D/G bands under discussion for 6G. Differential mixers/amplifier and fundamental device characterization with a broadband VNA will be discussed.

Thursday, June 15 –  A Paradigm Shift in Distributed Modular VNA Architecture That Makes Long Distance Measurement Simple and Easy – In his final talk, Navneet Kataria will present an innovative distributed modular VNA architecture powered by PhaseLync™ technology. It can dramatically simplify the setup, calibration and measurement for total path loss and group delay. PhaseLync presents numerous advantages in making long distance vector-corrected S-parameter measurements, especially for antenna measurements inside chambers or in over-the-air outdoor ranges.