This high resolution EMC/EMI diagnostic system has been reinvented to assist high density board designers to visualize the root causes of potential EMC and EMI problems during pre- and post-EMC compliance testing.
Agilent Technologies Inc. announced it will demonstrate its latest PXI Functional Test System, plus boundary scan and latest inline in-circuit test systems, at NEPCON EMT China 2014 (Booth 1G60), April 23-25, at the Shanghai World Expo Exhibition & Convention Center.
Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.
The industry-accepted testing paradigm is under stress to accommodate an explosion of new test cases without corresponding increases in budget or time to market. At CTIA 2013, Azimuth unveiled solutions for a new testing paradigm.
Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.
Rohde & Schwarz has added three new options for its compact R&S DST200 RF diagnostic chamber: the R&S DST-B160 automated 3D positioner, the R&S DST-B210 cross-polarized test antenna and the R&S DST-B270 communications antenna. The new options significantly speed up precompliance testing of wireless devices, allowing automated test sequences to be performed on the lab bench so that developers no longer require constant access to large RF test chambers.