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Items Tagged with 'diagnostic'

ARTICLES

Agilent Technologies to demonstrate new PXI functional test system at NEPCON China 2014

April 23, 2014

Agilent Technologies Inc. announced it will demonstrate its latest PXI Functional Test System, plus boundary scan and latest inline in-circuit test systems, at NEPCON EMT China 2014 (Booth 1G60), April 23-25, at the Shanghai World Expo Exhibition & Convention Center.


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Agilent simplifies discontinuous disturbance measurements with new capabilities in MXE EMI receiver

Test & Measurement
April 3, 2014

Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.


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Azimuth unveils solutions for mobile performance testing

Software/EDA
May 16, 2013

The industry-accepted testing paradigm is under stress to accommodate an explosion of new test cases without corresponding increases in budget or time to market. At CTIA 2013, Azimuth unveiled solutions for a new testing paradigm.


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Agilent to demo new solutions enabling tests from prototype validation to inline high-volume manufacturing at IPC APEX

February 1, 2013

Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.


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R&S takes wireless device precompliance testing into the lab

June 12, 2012

Rohde & Schwarz has added three new options for its compact R&S DST200 RF diagnostic chamber: the R&S DST-B160 automated 3D positioner, the R&S DST-B210 cross-polarized test antenna and the R&S DST-B270 communications antenna. The new options significantly speed up precompliance testing of wireless devices, allowing automated test sequences to be performed on the lab bench so that developers no longer require constant access to large RF test chambers.  


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