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Mobile operators, OEMs, chipset and infrastructure vendors are challenged as never before with the deployment of new network, device and service technologies. The industry-accepted testing paradigm is under severe stress to accommodate an explosion of new test cases without corresponding increases in budget or time to market. At CTIA 2013, Azimuth is pleased to unveil solutions for a new testing paradigm.
Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.
Rohde & Schwarz has added three new options for its compact R&S DST200 RF diagnostic chamber: the R&S DST-B160 automated 3D positioner, the R&S DST-B210 cross-polarized test antenna and the R&S DST-B270 communications antenna. The new options significantly speed up precompliance testing of wireless devices, allowing automated test sequences to be performed on the lab bench so that developers no longer require constant access to large RF test chambers.
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