Articles by Anritsu Co.

New VNA Technologies Enable Millimeter-Wave Broadband Testing to 220 GHz

Application development in the millimeter-wave (mmWave) frequencies for terrestrial communication, high-frequency device characterization, automotive radar, and other technologies is increasing. The challenge of testing and characterizing the devices that enable new solutions is becoming increasingly complex. As broadband testing over hundreds of gigahertz of bandwidth is subject to repeatability and accuracy deficits, researchers and engineers are demanding better broadband solutions that help to overcome these challenges and simplify mmWave testing.


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64-Gbaud PAM4 Pulse Pattern Generator

PAM4 Modules

Anritsu Company introduces 64-Gbaud PAM4 PPG and 32-Gbaud PAM4 ED modules supporting 400 GbE and Over 400 G bit error rate (BER) tests for its Signal Quality Analyzer-R MP1900A BERT.


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RF and Microwave Material Measurements: Techniques and Applications

Continual demand to accurately measure dielectric and magnetic properties of material is a common need and apparent in our everyday lives. There is a need to quantitatively characterize material properties at RF and microwave frequencies. Learn more about the use of vector network analyzers (VNAs) as flexible and versatile tools to accurately and quantitatively characterize material properties and showcase the broad applicability of the VNA as a tool to accurately do this at high frequencies. Learn techniques and applications of RF and microwave material measurements.


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Anritsu

Time Difference of Arrival (TDOA)

Time Difference of Arrival (TDOA) is a technique for geo-locating RF sources. It requires three or more remote receivers (probes) capable of detecting the signal of interest. Each probe is synchronized in time to capture corresponding I/Q data blocks. Software shifts the time signature of each I/Q data set to find the difference in the arrival time at each probe.


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