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Test and Measurement Channel / Industry News

Anritsu to showcase test solutions for LTE, narrowband, P25, and more at IWCE

March 8, 2013
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Anritsu Co. will be exhibiting the new P25 Phase 2 TDMA analysis capability of its S412E LMR Master, as part of its portfolio of test solutions to address the key technologies associated with public safety networks – including LTE, narrowband and P25 – during IWCE 2013 in Las Vegas, March 11-15. Designers and manufacturers of public safety radios, as well as engineers and technicians responsible for the deployment, installation, and maintenance of wireless networks will find test instruments to meet their requirements in the Anritsu booth (#813).

Headlining the test solutions in the booth will be the S412E, which is the only handheld analyzer for P25 Phase 2 on the market. Additionally, the S412E LMR Master can be used to field test the RF performance of P25, NXDN™, ETSI DMR, MotoTRBO™, and 700 MHz LTE public safety radio systems in the Part 90 spectrum allocations. LMR Master also supports emerging Positive Train Control systems. The S412E combines the cable and antenna analysis capabilities of Anritsu’s Site Master™ and VNA Master™ with a powerful spectrum analyzer, modulated signal generator, internal power meter, analog FM and digital LMR signal/modulation analyzers, and a GPS receiver for coverage mapping into a single, portable, battery-operated instrument for ultimate flexibility in site and field measurements.

Also on display for the first time at IWCE will be MW82119A PIM Master™, the industry’s first high-power, battery-operated, portable PIM test analyzer. It incorporates Anritsu’s patented Distance-To-PIM™ (DTP) technology, allowing users to pinpoint the location of PIM problems, whether they are on the tower or outside the antenna system.

Anritsu will be exhibiting the MS2830A Signal Analyzer and MG3710A Vector Signal Generator, which can accurately test the performance of public safety receivers for narrowband applications. The MS2830A has best-in-class dynamic range, with an average noise level (DANL) of –153 dBm, and third-order intermodulation distortion (TOI) of +15 dBm, as well as excellent total level accuracy of typically ±0.3 dB, due to unique level calibration technology.   

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