- Buyers Guide
Anritsu Co. introduces TD-SCDMA signaling test capability for its industry-leading Rapid Test Designer (RTD) solution. The new software enables chipset and mobile device makers to reliably and cost-efficiently test their implementation of the 3G mobile communications standard used by China Mobile®, the world’s largest mobile network operator.
TESEQ, a leading developer and provider of instrumentation and systems for EMC emission and immunity testing, have expanded its capability in field probe calibration to deliver calibration data at all frequencies defined in the IEC 61000-4-3 standard.
Anritsu Corp. has announced that the company has received the world's first PTCRB approval for its ME7873L RF Conformance Test System meeting the LTE Rel-10 Carrier Aggregation Standard.
Teseq has expanded its capability in field probe calibration to deliver calibration data at all frequencies defined in the IEC 61000-4-3 standard.
RFMW Ltd. announces design and sales support for two new broad band, high-performance switches from Peregrine Semiconductor. Targeting the test and measurement market, the PE42520 and PE42521 SPDT switches offer performance to 13GHz at a 36dBm power rating. The resulting input IP3 (IIP3) is 66dBm while IIP2 is 115 dBm.
Manufacturers and test houses can now use the R&S VTC and R&S VTE video testers from Rohde & Schwarz to test next-generation HDMI sink devices with ultra-HD or 4k screen resolution. This is possible thanks to the new R&S VT-B360 HDMI TX 300 MHz HDMI module, which is equipped with four parallel HDMI channels with ultra-HD resolution. Tests can be performed on TVs, monitors, projectors and A/V receivers with conventional screen resolutions as well.
Vaunix Technology Corp., (www.vaunix.com), a manufacturer of USB controlled and powered test equipment, is pleased to announce they’ll be displaying their latest models of USB powered Lab Bricks at the International Microwave Symposium (IMS) in Seattle, WA June 4-6th in booth #2042.
Anritsu Co. (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.
Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.
Mesuro has launched a new test solution that utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments.
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