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Automatic Fixture Removal (AFR) is a simple and an accurate way to de-embed a measurement fixture. These fixtures are typically used when measuring Surface Mount Device (SMD) type components to provide an interface from the Vector Network Analyzer (VNA) test port cables to the Device Under Test (DUT). The main challenge when characterizing such components is to completely isolate the actual DUT characteristics from the fixture; which becomes even more challenging at higher frequencies.

In Part 1, we introduced the phased array concept, beam steering, and array gain. In Part 2, we presented the concept of grating lobes and beam squint. In this section, we begin with a discussion of antenna sidelobes and the effect of tapering across an array. Tapering is simply the manipulation of the amplitude contribution of an individual element to the overall antenna response.

Taking the R&S ESR EMI test receiver as an example, this paper looks at a CISPR 16-1-1- compliant test instrument with time domain scanning capabilities. The paper compares the measurement speed and level measurement accuracy of a conventional stepped frequency scan versus an advanced FFT-based time domain scan. It also contains guidance on making optimum use of time domain scans.

Phase-critical analog and digital transceiver systems are increasingly relied upon in global Aerospace & Defense programs, due, in part, to the rapid advancement and growth of high-resolution phased array antenna technology. These advancements are enabling significant innovation in satellite-based communications (SATCOM), surface, airborne, and space-based radars, secure point-topoint communications, autonomous vehicles, electronic warfare (EW), and space research.

Phase-critical analog and digital transceiver systems are increasingly relied upon in global Aerospace & Defense programs, due, in part, to the rapid advancement and growth of high-resolution phased array antenna technology. These advancements are enabling significant innovation in satellite-based communications (SATCOM), surface, airborne, and space-based radars, secure point-topoint communications, autonomous vehicles, electronic warfare (EW), and space research.

Taking the R&S ESR EMI test receiver as an example, this paper looks at a CISPR 16-1-1- compliant test instrument with time domain scanning capabilities. The paper compares the measurement speed and level measurement accuracy of a conventional stepped frequency scan versus an advanced FFT-based time domain scan. It also contains guidance on making optimum use of time domain scans.

In Part 1, we introduced the phased array concept, beam steering, and array gain. In Part 2, we presented the concept of grating lobes and beam squint. In this section, we begin with a discussion of antenna sidelobes and the effect of tapering across an array. Tapering is simply the manipulation of the amplitude contribution of an individual element to the overall antenna response.

Automatic Fixture Removal (AFR) is a simple and an accurate way to de-embed a measurement fixture. These fixtures are typically used when measuring Surface Mount Device (SMD) type components to provide an interface from the Vector Network Analyzer (VNA) test port cables to the Device Under Test (DUT). The main challenge when characterizing such components is to completely isolate the actual DUT characteristics from the fixture; which becomes even more challenging at higher frequencies.

Most ADAS functions rely on radar sensors, and these safety-critical components must function correctly even under the most demanding of RF environments. The white paper describs a test procedure to replicate real life scenarios where the ADAS radar functions are activated during EMS testing and it contains some very interesting results.

RF front-end architectures grow more complex with each generation of communication systems. To accommodate these architectures, more densification and miniaturization is taking place with electronic systems implemented through innovations in system-in-package (SiP) design. Cadence offers the broadest, most integrated design solution to bring the Intelligent System Design™ strategy to the communication products of the future.