Articles Tagged with ''GaN''

New Cree GaN HEMT die available via distribution

 Cree, Inc. has made seven new GaN HEMT die available through distribution via Mouser. Manufactured on silicon carbide (SiC) substrates using a either 0.4 or 0.25 μm gate length fabrication process, the gallium nitride (GaN) high electron mobility transistor (HEMT) die exhibit superior performance properties compared to silicon (Si) or gallium arsenide (GaAs) die, including: higher breakdown voltage, higher saturated electron drift velocity, higher thermal conductivity, and higher efficiency. 


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Richardson RFPD to Sponsor EDI CON GaN Panel

Richardson RFPD Inc.has announced its Gold-level sponsorship of the Electronic Design Innovation Conference (EDI Con 2014) to be held at the Beijing International Convention Center, Beijing, China, April 8-10, 2014. As a gold sponsor, Richardson RFPD will organize a special expert forum discussing the state-of-the-art in Gallium Nitride (GaN) semiconductor technology targeting high-power RF and microwave applications. As the sponsor, Richardson RFPD has assembled a panel of experts from leading suppliers of discrete transistors and integrated circuits based on GaN technology.


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