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White Papers


Head to Head: NI PXIe-5665 Versus Traditional Boxed Instruments

NIThis paper discusses the setup details for the demo shown in this video Head to Head: NI 5665 vs. Traditional Boxed Instruments. The demo compares the performance and speed of the NI PXIe-5665 with the Agilent PXA. Rather than comparing the datasheet specifications of both instruments, this video compares the two instruments while performing real- world test scenarios.

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An ideal RF Power Technology for ISM, Broadcast and Commercial Aerospace Applications

RF laterally diffused MOS (LDMOS) is currently the dominant device technology used in high-power RF power amplifier (PA) applications for frequencies ranging from 1 MHz to greater than 3.5 GHz. This paper will include device and design considerations that specifically target enhancing ruggedness performance. The features of the products using this platform will also be presented.

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RFID objects monitoring in space bounded by metallic walls.

Considered problem is the reading of multiple RFID tags in the region of space, which is bounded by metal walls and has resonant radio-engineering properties. Obtained results show that it is possible to get reliable automated monitoring of items with tags by forming of a local electromagnetic field (EMF) with the help of slow-wave structures (SWS).
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An AESA Revolution Utilizing the Disruptive Technology of Highly-Integrated Silicon ICs

We will first present an overview of phased-array antenna fundamentals and basic Active Electronically Scanned Array (AESA) principles and challenges, and then we will explain how planar solutions can help with form-factor issues. We will also show how planar solutions at frequencies at or above X-band require increased integration, as well as highlighting some associated challenges.

Integration and Operational Guidelines for MEMS-Based Inertial Systems: Applications that Include Magnetometers

High-performance inertial systems provide accurate platform heading information in a variety of applications and operational environments. However, the magnetometers used are susceptible to measurement distortion in the presence of any magnetic material. This white paper documents product integration and on-board calibration procedures that mitigate distortion and optimize overall product performance.

Characterizing Components in Wireless Power Transfer (WPT) Systems

A key factor in designing Wireless Power Transfer (WPT) devices is the performance of the power transfer efficiency between coupled coils and resonators. Consequently, the ability to characterize these components and measure power transfer efficiency in real-time is paramount. Download the new application note to learn the theory of WPT, measurement requirements for components in WPT systems and how to characterize key parameters.

Carry Precision With You To Ka Band & Beyond

Keysight's rugged, dependable FieldFox handheld analyzers are designed to deliver precise, lab-grade measurements up to 50 GHz. Explore Keysight's FieldFox application note and webcast library, to help you solve your toughest measurement challenges to Ka band and beyond. Includes these three app notes updated to cover measurements up to 50 GHz: Correlating Microwave Measurements between Handheld and Benchtop Analyzers; Precision Validation, Maintenance and Repair of Satellite Earth Stations FieldFox Handheld Analyzers; Techniques for Precision Validation of Radar System Performance in the Field. Explore FieldFox. Get app notes, webcasts & more.

Radar and Electronic Warfare Systems Design Resources

Electronic Warfare Fundamentals Poster. This poster contains a radar warning receiver and DRFM based jammer block diagrams, a compare and contrast of Radar versus EW, basic equations, cross-eye jamming, modern jamming techniques, three areas of EW; common acronyms and the latest hardware and software for electronic warfare test and measurement.

Using CCDF as a Method of Measuring P1dB and P3dB

Top methods to analyze amplifiers compression characteristics and performance of peak power capabilities.

RF Measurements Application Note

Modern modular digitizers, like the Spectrum M4i series PCIe digitizers, offer greater bandwidth and higher resolution at any given bandwidth than ever before. Although they are in the class of general purpose measuring instruments they are capable of many RF and lower microwave frequency measurements. This article focuses on some examples of common RF measurements that can be performed with these modular digitizers.

IMS2015 MicroApps CD - free while supplies last!

The MicroApps program at the IEEE MTT-S International Microwave Symposium (IMS2015) held in Phoenix, Arizona, had nearly 80 presentations covering the hottest topics in RF/uW.  If you missed this important event, you can still get an official copy of the CD containing the presentation material - compliments of Keysight Technologies. Order now and as a bonus, get access to the content presented at the inaugural RF Boot Camp session!

Fundamentals of Arbitrary Waveform Generation, AWG Primer

Today's AWGs can address a broad range of applications and test cases. This primer discusses characteristics and fundamentals of arbitrary waveform generation and the different implementations available in the market. It also shows examples how to generate digital, multi-level and PAM4 signals, wireless and modulated waveforms, multi-carrier as well as coherent optical signals. It explains the different methods of wideband IQ modulation and up-conversion, calibration and correction, and wrap-around handling for RF/wireless signals.

IMD Measurements with IMDView MS4640B Series Vector Network Analyzer

Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. A common technique for testing IMD is the use of two tones. Two-tone testing for IMD has been used to characterize the non-linearity of microwave and RF components, both active and passive, for a very long time. Traditionally, this has been done at fixed frequencies using multiple signal generators, a combiner, and a spectrum analyzer. Because IMD varies with frequency, these measurements must be repeated at various frequencies to get a clear picture of what a deviceâ??s true behavior is across its specified operating range. This can be a time consuming process using the traditional signal generators and spectrum analyzers. The Anritsu VectorStar MS4640B Series Vector Network Analyzers can be used to quickly and accurately make S parameter, gain compression, fixed and swept frequency IMD measurements using a single cable connection to the DUT.


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