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Articles by Agilent Technologies Inc., Santa Clara, CA

Agilent test equipment used by AT4 Wireless for LTE-A certification services

January 10, 2014

Agilent Technologies Inc. announced that AT4 wireless has selected Agilent test equipment to provide certification testing services for LTE-Advanced/Carrier Aggregation (LTE-A/CA).


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GoldenGate 2013.10 RFIC Software

Software/EDA
January 6, 2014

GG_(shared)-01Agilent Technologies Inc. announced the release of GoldenGate, its RFIC simulation, verification and analysis software. Agilent EEsof EDA’s GoldenGate 2013.10 provides RFIC designers with easy-to-use EVM-, BER- and ACPR-type measurements and enables them to quickly analyze and diagnose problem areas in large-signal analysis.


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Agilent's model extraction and qualification software adopted by Microchip Technology

December 9, 2013

Agilent Technologies Inc. announced that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA’s Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design kits, modify external foundry libraries, and validate supported devices from internal and external sources.


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Agilent extends coverage for OEM market with new PCIe high-speed digitizer

November 22, 2013

Agilent Technologies Inc. announced the extension of its next generation of high-speed digitizers supporting custom on-board signal processing capability with the new compact U5309A 8-bit PCIe(r) digitizer sampling up to 2 GS/s.


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Agilent introduces FieldFox pulse measurements to simplify radar field testing

Test & Measurement
October 3, 2013

Agilent Technologies Inc. introduced a pulse measurement option for its FieldFox handheld analyzers that is designed to further simplify radar field testing.


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Agilent to demonstrate newest design and test solutions at EuMW

September 26, 2013

Agilent Technologies Inc. announced it will demonstrate a wide range of new high-performance, flexible test solutions for designing and testing components for radar systems, antennas and next-generation wireless devices at European Microwave Week (Booth 105) Oct. 6-11 at the Nürnberg Convention Center in Nuremberg, Germany.


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Agilent offers simplified power-added efficiency testing

September 26, 2013

If you are assessing the power conversion efficiency of your power amplifiers, you are probably making power-added efficiency (PAE) measurements. Most PAE test setups use multiple instruments – such as RF power meters, digital oscilloscopes and DC power analyzers – to calculate RF voltage and current measurements.


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Agilent accelerates smartphone, defense simulations by a factor of 64

September 24, 2013

Agilent Technologies Inc. announced that SystemVue, its premier platform for communications and aerospace/defense systems design, supports high-performance distributed computing. System architects of wireless, 4G smartphone and radar applications can now verify next-generation system performance up to 64 times faster using Linux-based grid computing managers such as the IBM Platform Load Sharing Facility.


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Agilent increases test efficiency with next gen of optical modulation analyzer software

September 18, 2013

Agilent Technologies Inc. introduced the next generation of optical modulation analysis software for its family of optical modulation analyzers. The new software makes it easy for photonic engineers to set up tests on their optical modulation analyzers, increasing test efficiency by cutting the number of steps in half. By automating the execution of tests, the software also minimizes testing errors.


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