Nickander J. Damaskos and Benuel J. Kelsall, Damaskos Inc.

Cavity Techniques for Substrate Properties at Microwave/Millimeter-wave Bands

For quality control in the design of microwave and millimeter-wave circuitry and devices, it is important to have a good measure of the dielectric properties of the materials employed. The standards and methods that are often employed for this purpose ...

December 1, 2003

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The setups presented are essentially of two types - thin dielectric sheet testers and z-axis testers. These are the tools that are employed to independently measure the components of the substrate dielectric constant. It is supposed that suitable propagation models may use this information to better predict propagation mode...

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