Cellular 4G/LTE Channel

Analog Devices’ 28 nm DAC Sets Performance Benchmarks

28 nm Digital-to-Analog Converter: AD9172

Analog Devices, Inc. (ADI) introduced a 28 nm digital-to-analog converter (DAC) as part of a series of high speed DACs. The AD9172 meets the demands of gigahertz bandwidth applications and delivers the increased spectral efficiency needed for 4G / 5G multi-band wireless communications base stations and 2 GHz E-Band microwave point-to-point backhaul radios. Its design benefits production instrumentation targeting multi-standard direct-to-RF signal synthesis and provides a solution for defense electronics requiring greater detection range. 


Read More

Rohde & Schwarz Announces TS-290 IoT Carrier Acceptance Test

IoT Carrier Acceptance Test System: TS-290

Manufacturers who want to integrate wireless modules into their products now face completely new test requirements. The US's largest wireless network operator is the first to publish specific test plans for IoT integrators. In response, Rohde & Schwarz announces the availability of its new R&S TS 290 IoT carrier acceptance test system, which is based on these test plans. Claimed to be the only test solution of its kind, it offers RF, protocol and performance test cases in a single box.


Read More

IDT and Epson Provide Low Phase Noise Timing for Telecom and Data Centers

Integrated Device Technology, Inc. (IDT) and Seiko Epson Corporation (Epson) have collaborated on a low phase noise timing solution for telecommunications and data center applications. IDT's new 8V19N474 jitter attenuator and frequency synthesizer, coupled with Epson's VG-4513 high performance voltage-controlled crystal oscillator (VCXO), provide best-in-class phase noise performance for demanding applications such as 40/100/400 Gbps Ethernet timing. For wired communications, the IDT-Epson solution meets physical layer specifications for phase noise, bit error rate and signal-to-noise ratio without external filtering.


Read More