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Articles Tagged with ''test''

Tektronix releases first test solution for MIPI M-PHY specification v3.1

Tektronix, Inc., the world's leading manufacturer of oscilloscopes, announced the first physical layer transmitter characterization and debug solution for the MIPI M-PHY® v3.1 specification recently approved by the MIPI® Alliance. The new Tektronix solution includes support for MIPI M-PHY high speed gears 1, 2 and 3, PWM mode (G0-G7), and SYS mode and offers the industry’s lowest noise solution for MIPI M-PHY measurements when used with Tektronix MSO/DPO 70000DX oscilloscopes and P7600 series probes.


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