Optimal+, a global big data analytics provider for the semiconductor industry, announced that it has collaborated with NI, a leading provider of platform-based test systems that enable engineers and scientists to solve the world’s greatest engineering challenges, so that the entire suite of solutions from Optimal+ will be supported by NI’s Semiconductor Test System (STS) via the Optimal+ Proxy starting in Q1 2016.
NI announced the release of its Automated Test Outlook 2016. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.
Anritsu Corp. has announced the availability of three new measurement software packages expanding the functions of the MT8870A Universal Wireless Test Set to support manufacturing tests of IoT/M2M applications.
Anritsu Co. (booth #717) will highlight its leadership position in high-speed digital test – displaying the industry’s only solution that supports 112G PAM4 generation and BER tests with accurate jitter injection – at DesignCon 2016. The new solution, which features the award-winning MP1800A BERT Signal Quality Analyzer (SQA) and new 64G baud 2-bit DAC with MUX, is part of a portfolio of test solutions and technologies that Anritsu will showcase to help engineers verify high-speed chip, board, and system designs used for emerging networks.
Keysight Technologies Inc. announced the addition of GSM, GPRS, EGPRS and TD-SCDMA, HSPA test capabilities to the E7515A UXM wireless test set. With these enhancements, UE developers can validate their multi-format LTE devices within a single UXM test set.