advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Articles Tagged with ''test''

Optimal+ announces big data analytics support for NI semiconductor test system

Optimal+, a global big data analytics provider for the semiconductor industry, announced that it has collaborated with NI, a leading provider of platform-based test systems that enable engineers and scientists to solve the world’s greatest engineering challenges, so that the entire suite of solutions from Optimal+ will be supported by NI’s Semiconductor Test System (STS) via the Optimal+ Proxy starting in Q1 2016.


Read More

NI Automated Test Outlook reinforces need for smarter test systems

NI announced the release of its Automated Test Outlook 2016. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.


Read More

Anritsu to highlight high-speed design test leadership position at DesignCon 2016

Anritsu Co. (booth #717) will highlight its leadership position in high-speed digital test – displaying the industry’s only solution that supports 112G PAM4 generation and BER tests with accurate jitter injection – at DesignCon 2016. The new solution, which features the award-winning MP1800A BERT Signal Quality Analyzer (SQA) and new 64G baud 2-bit DAC with MUX, is part of a portfolio of test solutions and technologies that Anritsu will showcase to help engineers verify high-speed chip, board, and system designs used for emerging networks.


Read More

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement