Teledyne LeCroy, Coherent Solutions Ltd., Anritsu Co. and Oclaro Inc. announced a new joint effort to demonstrate the highest performance single-carrier 16 QAM signal generation and analysis capabilities available at 56 Gbaud. The demonstration of the partners’ latest optical communications test equipment platform takes place at OFC 2016 in Anaheim, Calif. in the Teledyne LeCroy Booth #1115.
Anritsu Co. announces exclusive support for LTE 4x4 Multiple-In-Multiple-Out (MIMO) Carrier Acceptance Test (CAT) requirements for a major U.S. carrier. This new coverage, based on the ME7834LA Mobile Device Test Platform, builds on the leading 3G and LTE CAT test offering for this carrier. With this announcement, Anritsu is the first test solution provider in the world to offer a device acceptance solution for 4x4 MIMO.
For electrical field strength emissions measurement Gauss Instruments has introduced a novel real-time scanning feature for its TDEMI X test receiver series providing several gigahertz real-time bandwidth.
Cobham Wireless, a global leader in the provision of advanced wireless coverage and mobile communication systems, has announced that the next generation of the TM500 network test system has the capability to emulate tens of thousands of Machine Type Communications (MTC) devices, sometimes known as M2M devices.
Fairview Microwave Inc., a supplier of on-demand microwave and RF components, debuts a new family of semi-rigid test probes operating up to 6 GHz. Designed to assist in testing microwave circuits, these test probes are constructed of high quality semi-rigid coax and SMA female connectors.
Anritsu Co. announces it is a founding member of the Open Lab Alliance (OLA), a collaboration of industry leaders with the common goal of advancing connected vehicle and autonomous vehicle technologies. The OLA was officially launched during a grand opening ceremony at the CETECOM laboratory in Milpitas, Calif.on February 12, 2016.
Optimal+, a global big data analytics provider for the semiconductor industry, announced that it has collaborated with NI, a leading provider of platform-based test systems that enable engineers and scientists to solve the world’s greatest engineering challenges, so that the entire suite of solutions from Optimal+ will be supported by NI’s Semiconductor Test System (STS) via the Optimal+ Proxy starting in Q1 2016.