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Articles Tagged with ''test''

Anritsu and EMITE partner to deliver MIMO OTA LTE test solutions

January 11, 2012

Anritsu Corp. and EMITE have announced that the Anritsu MT8820C One-Box Tester has been selected by EMITE as a supported test solution for MIMO OTA LTE compliance testing.


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NXP to use Agilent electronic test products at Consumer Electronics Show

January 11, 2012

Agilent Technologies Inc. announced that its electronic test equipment will be used by NXP Semiconductors N.V. in a demonstration of its beam-forming technology for the next generation of communication and radar products at the International Consumer Electronics Show in Las Vegas, Jan. 10-13.


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Agilent delivers high-speed inter-chip compliance test software

January 11, 2012

Agilent Technologies Inc. announced the release of the first commercially available High-Speed Inter-Chip (HSIC) compliance test software for real-time oscilloscopes. The software automatically tests HSIC signals according to HSIC specifications.


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Link expands test capability with environmental chamber

Marketwatch: International
January 24, 2012

Link MicrotekLink Microtek has invested in a state-of-the-art environmental test chamber at its premises in the centre of Basingstoke, UK. The new Design Environmental Alpha 335H test chamber also supports the company's design-and-build service for RF and microwave subsystems.


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Aeroflex upgrades digital radio test set

January 25, 2012
Aeroflex Inc., a wholly owned subsidiary of Aeroflex Holding Corp., announced a major feature upgrade to its 3920 Radio Test Set.
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Agilent introduces add-in extensions for compliance application software

January 26, 2012
Agilent Technologies Inc. announced a product enhancement designed to help engineers extend the capabilities of compliance applications on the company’s Infiniium real-time oscilloscopes.


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Anritsu Enhances Cell Master™ and Spectrum Master™ To Better Meet LTE Field Test Requirements

January 17, 2012

Anritsu Company introduces enhanced MT8212E/MT8213E Cell Master™ and MS2712E/MS2713E Spectrum Master™ handheld analyzers that have new measurement capabilities and improved overall performance to address the rollout of 4G technologies, including TD-LTE. Offering superior performance in a compact design, the MT8212E/MT8213E and MS2712E/MS2713E offer service providers, network equipment manufacturers (NEMs), and third-party contractors and installers a cost-efficient and accurate test tool when deploying and maintaining LTE networks.


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Rohde & Schwarz simplifies measurement of radiated spurious emissions

January 30, 2012

Rohde & Schwarz is taking a completely new approach to measuring radiated spurious emissions on LTE devices, making it considerably easier for users to measure RSE in the presence of LTE carrier power. The solution is the R&S OSP open switch and control platform equipped with the new R&S OSP-B155 option.


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Kaelus introduces range to fault technology

February 2, 2012
Kaelus announced the availability of Range To Fault (RTF) technology for its 1800, 1900 and 2100 MHz iQA series PIM test instruments.
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National Instruments announces test solution for 802.11ac WLAN

February 3, 2012
National Instruments (NI) announced early access support for testing next-generation 802.11ac WLAN chipsets and devices.
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