Industry News Test and Measurement Channel

Tektronix Selects Teradyne J750 Semiconductor Test Systems

At IMS 2011, Tektronix Component Solutions (Booth 1432) announced the investment in five new Teradyne J750EX semiconductor test systems to allow screening of a wider variety of complex ASICs, increase test capacity and enable faster development of new test programs. Reducing development time will improve time-to-test for customers and reduce development cost.

The addition of the popular Teradyne systems will significantly expand the company’s test and screening services for high-density and high-speed ASICs and FPGAs for military, space, and commercial aerospace customers. Furthermore, the new systems can provide memory testing of digital devices up to 384-pins and test increasingly complex digital ICs. Typical application areas include full characterization of off-the-shelf parts at extended temperature ranges, verifying that device performance meets demanding military, aerospace or space standards.

“We’re making a significant capital investment to better serve the needs of the high performance mil-aero market,” said Tom Buzak, President, Tektronix Component Solutions. “We are fully committed to equipping our labs with state-of-the-art technology. The Teradyne test systems will help decrease test development time, reducing the cost of test for our customers while enabling the screening of increasingly complex devices.”

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