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Industry News / Semiconductors / Integrated Circuits / Test and Measurement

Tektronix Selects Teradyne J750 Semiconductor Test Systems

June 2, 2011
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At IMS 2011, Tektronix Component Solutions (Booth 1432) announced the investment in five new Teradyne J750EX semiconductor test systems to allow screening of a wider variety of complex ASICs, increase test capacity and enable faster development of new test programs. Reducing development time will improve time-to-test for customers and reduce development cost.

The addition of the popular Teradyne systems will significantly expand the company’s test and screening services for high-density and high-speed ASICs and FPGAs for military, space, and commercial aerospace customers. Furthermore, the new systems can provide memory testing of digital devices up to 384-pins and test increasingly complex digital ICs. Typical application areas include full characterization of off-the-shelf parts at extended temperature ranges, verifying that device performance meets demanding military, aerospace or space standards.

“We’re making a significant capital investment to better serve the needs of the high performance mil-aero market,” said Tom Buzak, President, Tektronix Component Solutions. “We are fully committed to equipping our labs with state-of-the-art technology. The Teradyne test systems will help decrease test development time, reducing the cost of test for our customers while enabling the screening of increasingly complex devices.”

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