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RanLOS AB recently secured a major deal with its distributor TOYO Corporation in which the RanLOS sub-6 GHz test system will be demonstrated to an international conglomerate as well as leading automotive manufacturers seeking for innovative connectivity test solutions in Asia.
Rohde & Schwarz and NOFFZ Technologies collaborate on the integration of the R&S Compact Antenna Test Range (CATR) reflector technology and advanced radar echo generator R&S AREG800A into NOFFZ’s UTP 5069 CATR.
Keysight announced the new Keysight P9002A parallel parametric test system, which provides high throughput and cost-effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing.
