New near-field probe with high resolution up to 10 GHz from Langer EMV-Technik

The SX probe heads' high measurement resolution allows the developer to pinpoint RF sources of between 1 and 10 GHz on densely packed printed circuit boards or on IC pins. The handy compact pin shape of the EMC near-field probes from Langer EMV-Technik GmbH provides the developer with convenient working conditions on the respective PCB.

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Langer's ChipScan-ESA software for measurements with a spectrum analyzer

 The ChipScan-ESA analysis software from Langer EMV-Technik GmbH has been designed for the clear and comparable recording of a spectrum analyzer's measurement curves (system requirements: Windows XP and later). It allows the user to visualize measuring curves quickly and interactively, perform complex analyses and export the curves easily 

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