Test and Measurement Channel

Test and measurement related articles

ARTICLES

Spectrum Launches Next Generation of 16-Bit Digitizers

First Products of a Digitizer Card Series

Spectrum Instrumentation announced the first products of a digitizer card series, featuring a completely new design. It consists of the new M2p platform-board, which will be the PCIe base for all upcoming products for the next years. The other part is the new 59xx module, which will be available in many variations. The M2p platform and 59xx module form 13 different new digitizer cards with numerous options regarding speed and channels.


Read More

Keysight Santa Rosa Headquarters Resumes Operations

Keysight Technologies' corporate headquarters in Santa Rosa, California has resumed operations after being temporarily closed due to the wildfires in Northern California. All four main buildings at the site are intact, and the majority of production facilities are back in operation, according to the company. Keysight affirmed the fourth quarter 2017 financial guidance provided in its third quarter earnings release on August 30, 2017.


Read More

DOCUMENTS AND FILES

Bridging the Gap Between RF Front-End Module Characterization and Production Test With the Semiconductor Test System

With the modern mobile device revolution, semiconductor suppliers are challenged to increase capability, integration, and performance while reducing time to market. Test needs a new approach based on an open, flexible platform at significantly lower cost. NI is bridging this gap by building on the stability and capability of the PXI platform to deliver off-the-shelf modular technology to both the characterization and production engineer.

Optimizing IP3 and ACPR Measurements

Learn techniques to improve your instrument’s ability to measure intermodulation distortion, third-order intercept, and adjacent channel power ratio.

Achieving Accurate RF and Microwave Power Measurements for Satellite Thermal Vacuum Test

This application note compares the commonly-implemented power measurement test setups for TVAC with a new test method that uses TVAC-qualified LAN power sensors. The paper explains how this new test method provides a simplified test setup, and more accurate and reliable microwave power measurements for TVAC testing of satellite equipment.

Noise Figure Measurements: Theory and Applications

Learn about the fundamentals of noise and noise figure measurements, including the Y-factor technique and methods to calculate measurement uncertainty.

Overcoming High-speed Interconnect Challenges

Cloud computing, smart phones, and LTE services are causing a large increase in network traffic. Instantaneous traffic rates at internet data centers have reached 1 Tbit/s. Supporting this increased traffic, speed of IT equipment used in high-end services in data centers must be increased. This white paper discusses challenges introduced at these higher data rates and how Vector Network Analyzers can help meet these.

Calculating VNA Measurement Accuracy

Vector Network Analyzers (VNA) are your primary resource when analyzing and characterizing systems and components for RF and Microwave measurements. They are regarded as accurate measuring instruments, however, quantifying the accuracy performance of a VNA in a specific application can be challenging. VNA specifications are a starting point; but, they are based upon very specific calibration and measurement conditions, which are not applicable for many applications.

Synchronization for Next Generation Networks - The PTP Telecom Profile

This paper is designed to help network engineers, network planners, and network operations understand how to deploy Precision Time Protocol (PTP, or IEEE 1588). PTP is a next generation, packetbased timing protocol targeted for use in asynchronous network infrastructures based on packet transport technologies.

Advanced VNA Cable Measurements

This field brief will discuss phase-matching cables, S-parameter definitions as they apply to cable characterization and other cable parameters such as Phase Shift and Group Delay. Advanced Time-Domain measurements will also be presented as enhancements to the well-known Distance-to-Fault (DTF) techniques. In addition, diagnostic tools like the Smith Chart will be briefly described.

Oscilloscope Fundamentals

The oscilloscope is arguably one of the most useful tools ever created for use by electronic engineers. In the more than five decades since the modern analog oscilloscope was created, hundreds of useful documents and thousands of articles have been written about what it is, how it works, how to use it, and application-specific examples of the oscilloscope in action. It is the purpose of this primer to instead describe digital oscilloscopes, which have for practical purposes replaced their analog predecessors in the vast majority of applications.