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Test and Measurement

Test and measurement products

ARTICLES

CST and Delcross announce distribution agreement

May 14, 2012

CST has announce that Delcross Technologies’ Electromagnetic Interference Toolkit (EMIT) is now available through the CST of America sales channel. The software will be fully supported by CST’s skilled team of electromagnetic specialists.


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Rohde & Schwarz breaks ground with €52 million investment in Singapore

MarketWatch: International
May 04, 2012

R&S breaks ground in SingaporeRohde & Schwarz is investing €52 million in Singapore’s economy over the next three years. The investment includes a brand new €35 million building at Changi Business Park.


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Agilent Technologies Introduces 6-GHz High Performance Signal Generators

May 02, 2012
Agilent Technologies announced four new X-Series signal generators that provide unmatched performance in phase noise, output power, ACPR, EVM and bandwidth. With these capabilities, Agilent’s new MXG and EXG products (available in analog and vector models) support the development of components and receivers that meet the complex challenges of mitigating interference, speeding data throughput and increasing signal quality in applications such as radar, military communications and consumer wireless.
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EB launches scalable radio channel emulator with high emulation capacity

TestBench
April 26, 2012

EB Propsim F32EB (Elektrobit Corp.) has introduced the EB Propsim F32 radio channel emulator for testing the performance of wireless networks, base stations, terminals and chipsets utilizing multi-antenna and multi-radio technologies.


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MILMEGA wins Queen’s Award for Innovation 2012

April 23, 2012

MILMEGA Ltd has been awarded a Queen’s Award for Enterprise in Innovation for developing amplifiers, based on a novel design methodology, using gallium nitride-based transistors, for use in Electromagnetic Compatibility (EMC) test equipment.


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MIMO Expert Forum at CTIA 2011 – Top Ten Questions….and Answers!

April 06, 2012
The CTIA MIMO Expert Forum brought together technologists from ETS-Lindgren, Agilent Technologies, Spirent Communications and EB (Elektrobit) to discuss the challenges of OTA testing. The “Top Ten” questions received from attendees at last year’s CTIA MIMO Expert Forum are answered below.
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Voice and SMS in LTE

White Paper
April 05, 2012
This white paper summarizes the technology options for supporting voice and short message service (SMS) in LTE, including circuit switched fallback (CSFB), SMS over SGs, and voice over LTE (VoLTE). It includes background information on the standardization process, and the commercial implications for the different options. The white paper also addresses test and measurement requirements resulting from the support of voice and SMS in LTE.
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Anritsu PIM Master available to rent from Microlease in Europe

March 12, 2012

Microlease has become the first test equipment specialist to offer the newly-released Anritsu MW8209A PIM Master as a rental option. The analyser covers the 900 MHz band and is designed to address the growing requirement for the measurement of PIM in E-GSM networks, including UMTS Band VIII and LTE Band 8.


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AtlanTecRF introduces satellite loop test translator with synthesised LO

March 12, 2012

AtlanTecRF claims that its new ALR series of Satellite Loop Test Translators (LTT) introduces, for the first time, the concept of synthesised Local Oscillator (LO) frequency control to provide the user with a compact, versatile and comprehensive approach to satellite communications equipment alignment and quality monitoring in both the Ka-band and Ku-bands.


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Anritsu and Signalion collaborate on 3GPP LTE-Advanced testing

March 05, 2012

Anritsu Corp. and Signalion GmbH conducted a successful IOT for the 3GPP LTE-Advanced ‘carrier aggregation’ feature with an IP downlink throughput of 300 Mbps. Both companies are leaders in providing test solutions for the 3GPP LTE radio technology and as a result of this IOT collaboration, the two companies will supply dependable test solutions for 3GPP LTE-Advanced.


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EVENTS

Mini-Circuits' Smart Portable Test Equipment

03/13/12


Technical Education Webinar Series Read More

IEEE 802.11ad PHY Layer Testing

03/08/12
Agilent Technologies
Agilent in Wireless Communications Webcast Series

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DOCUMENTS AND FILES

Statistical Analysis of Modern Communication Signals

May 14, 2012
The introduction of this digital transmission technology has made it necessary to deal with peak power levels up to 20 dB above the average value. All of the RF power components must be capable of handling these high voltage peaks to avoid break down, or flash over.

How to Measure 5-nanosecond Rise/Fall Time in Pulsed Power Amplifiers

April 06, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with the 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Voice and SMS in LTE

April 06, 2012
This white paper summarizes the technology options for supporting voice and short message service (SMS) in LTE, including circuit switched fallback (CSFB), SMS over SGs, and voice over LTE (VoLTE). It includes background information on the standardization process, and the commercial implications for the different options. The white paper also addresses test and measurement requirements resulting from the support of voice and SMS in LTE.

Improving Measurement Accuracy for High Frequency RF Connectors

April 06, 2012
Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during and after calibration of your microwave test instrument.

How to measure 5-nanosecond rise/fall time in pulsed power amplifiers

March 14, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Multi-tone Testing Can Save Both Time and Money

March 14, 2012
AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time.

Creating a Solution for Testing Frequency-Hopping Spread Spectrum Devices

February 15, 2012
Wide bandwidth, high resolution AWGs
Measurement needs have driven the development of high-bandwidth AWGs, but they lacked accuracy and high resolution. Until now, AWG technology forced serious trade-offs between either high resolution or wide bandwidth. With the new Agilent M8190A 12 GSa/s arbitrary waveform generator, you will get both in one instrument!

Solutions for LTE-Advanced Physical Layer Design and Test

February 15, 2012
LTE-Advanced (LTE-A) is an emerging mobile communications standard that boasts a number of significant benefits, including the ability to take advantage of advanced topology networks and achieve target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink. This white paper covers using signal generation and analysis to overcome challenges associated with carrier aggregation.

Electronically Scanned Arrays for Fast Testing of Large Antennas

February 12, 2012
This paper discuss the adaptation of the fast multi-probe technology to an existing classical planar near field facility through the manufacturing, installation and test of a partial demonstrator in Thales Alenia in Toulouse.

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