Understanding mechanical tolerances, coaxial design details and connector materials used in cable assemblies helps
produce communications equipment with the lowest levels of passive intermodulation (PIM).
This paper discusses the setup details for the demo shown in this video Head to Head: NI 5665 vs. Traditional Boxed Instruments. The demo compares the performance and speed of the NI PXIe-5665 with the Agilent PXA. Rather than comparing the datasheet specifications of both instruments, this video compares the two instruments while performing real- world test scenarios.
RF laterally diffused MOS (LDMOS) is currently the dominant device technology used in high-power RF power amplifier (PA) applications for frequencies ranging from 1 MHz to greater than 3.5 GHz. This paper will include device and design considerations that specifically target enhancing ruggedness performance. The features of the products using this platform will also be presented.
Considered problem is the reading of multiple RFID tags in the region of space, which is bounded by metal walls and has resonant radio-engineering properties. Obtained results show that it is possible to get reliable automated monitoring of items with tags by forming of a local electromagnetic field (EMF) with the help of slow-wave structures (SWS).
This whitepaper discusses some of the candidate waveforms, and then introduces a new flexible testbed for 5G waveform generation and analysis. This testbed combines software solutions with test equipment to investigate and to perform “what if” scenarios for new emerging 5g waveform applications. Ensure you have the flexibility needed for creation and analysis of prototype 5G signals.
This white paper features key, yet-to-be published Massive MIMO topics and how a testbed can be used to accelerate wireless research by enabling the validation of simulated results through rapid prototyping.
This paper from Southwest Antennas explores the basics of MIMO (multiple-in, multiple-out) communication technology, specifically focusing on the current generation of portable, tactical MIMO radios and the antenna technology that help make MIMO an attractive choice for today’s mobile wireless networks.
Leveraging single positive bias E-pHEMT MMICs for microwave signal chains has SWaP-C benefits over legacy dual bias D-pHEMT technology. Beyond eliminating bias sequencing circuitry, new PAs and LNAs powered by E-pHEMT even offer higher gain and linearity. Get the extra headroom you need by downloading this tech brief today.
Legacy and traditional phase noise test equipment are large, heavy, complex, fragile, and expensive. This paper illustrates measurement sensitivity equivalency to the most common system in the market with advantages in being smaller, lighter, more reliable & capable, at a fraction of the cost.
Explore 5G cellular system waveforms, algorithms and techniques with Keysight’s 5G testbed hardware and software elements providing the flexibility needed to address the inherent challenges of signal generation and analysis.
Altair’s FEKO offers a wide spectrum of numerical methods and hybridizations, each suitable to a specific range of applications. Hybridization of numerical methods allows large and complex electromagnetic problems to be solved, thereby allowing solutions to problems that would be intractable with any individual method. This technical paper provides an overview of the methods.
This paper presents a new predictive capability for simulating massive MIMO antennas and beamforming in dense urban propagation environments. Wireless InSite's MIMO capability is used to show predictions for SINR at specific device locations and the actual physical beams, including unintentional distortions caused by pilot contamination.
Engineering is all about connecting ideas and solving problems, and every tool you master enhances your ability to contribute. Explore Keysight Signal Analysis Basics and build a stronger foundation that will help you deliver your next breakthrough.
Load-pull simulation is a very simple yet powerful concept in which the load or source impedance presented to an active device is swept and its performance is measured. Performance contours are then plotted on a Smith chart, which shows the designer how changing impedances impact the device’s performance.