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ARTICLES

Anritsu introduces electromagnetic field measurement system

Test & Measurement

Anritsu Co. introduced an electromagnetic field (EMF) radiation measurement system for its Spectrum Master™ MS271xE handheld spectrum analyzers and Cell Master™ MT8212E/MT8213E base station analyzers.


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Anritsu announces GCF LTE protocol conformance for Chinese carriers

As part of its commitment to support global wireless standards, Anritsu Co. announces that it is the market leader in approved test cases for TD-LTE Carrier Aggregation and is the only test company with Global Certification Forum (GCF)-approved TD-LTE test cases in the IMS Voice over LTE (VoLTE)-related technology of aSRVCC.


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Battery-Operated PIM Analyzer: MW82119B PIM Master™

Test & Measurement

 MW82119B PIM MasterAnritsu Co. breaks new ground in field wireless test with the introduction of the MW82119B PIM Master™, which combines a 40 W, battery-operated PIM analyzer with a 2 MHz to 3 GHz cable and antenna analyzer, eliminating the need to carry multiple instruments to measure the RF performance of a cell site.   It is MIL-STD-810G drop test rated and is designed to withstand transportation shock, vibration and harsh outdoor test conditions.


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Anritsu and EXPWAY partner to create test solution supporting eMBMS

Test & Measurement

 Anritsu Co. announces a cost-effective end-to-end solution for testing devices and chipsets supporting enhanced Multicast Broadcast Multimedia Service (eMBMS) for LTE Broadcast that incorporates EXPWAY’s e-Cast™ Broadcast Multicast Service Center server with the Anritsu MD8430A signaling tester and Rapid Test Designer.  


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RF VNAs: ShockLine MS46522A

shocklineAnritsu Co. addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.


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Anritsu extends leadership position in protocol conformance test

Anritsu Co. announced that the Global Certification Forum (GCF) recently confirmed at the CAG#38 meeting in Taipei that the Anritsu ME7834L Protocol Conformance Test (PCT) system has achieved the highest number of approved IMS test cases for device certification.


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Anritsu enables device testing using MD8475A signaling tester with integrated IMS

Anritsu Co. announces the availability of integrated IP Multimedia Subsystem (IMS) functionality for its MD8475A Signaling Tester. Adding this LTE functionality extends the capabilities of the MD8475A’s SmartStudio graphical network simulation environment to include Call Session Control Function (CSCF), Dynamic Host Configuration Protocol (DHCP), and Domain Name System (DNS) servers, using either IPv4, IPv6, or dual-stack addressing.
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Anritsu Co. enhances signal analyzers

Anritsu Co. introduces options for its MS269xA series that enhance the wideband FFT analysis of the signal analyzers. By expanding the measurement capability of the MS269xA series with the hardware options, Anritsu strengthens its position as a world leader in test solutions for microwave and next-generation mobile networks by providing a highly accurate analysis tool that can capture wideband signals used in satellite and radar systems, as well as in LTE Advanced designs.


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Anritsu PIM Master available to rent from Microlease in Europe

Microlease has become the first test equipment specialist to offer the newly-released Anritsu MW8209A PIM Master as a rental option. The analyser covers the 900 MHz band and is designed to address the growing requirement for the measurement of PIM in E-GSM networks, including UMTS Band VIII and LTE Band 8.


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Anritsu Time Domain Analysis Free Webinar


Free Anritsu Webinar - "Time Domain Measurements Utilizing the Unique Capabilities of the VectorStar™ VNA" - Watch Now

This presentation describes the use of the novel Anritsu VectorStar VNA to perform frequency domain S-parameter measurements and transform the frequency domain data to accurate step and impulse time domain data.

View an introduction to this program


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