Articles Tagged with ''calibration''

Anritsu adds dual wavelength measurement capability to O/E calibration modules

Anritsu Co. introduces two options for its MN4765B series of O/E calibration modules that help to create a highly accurate, flexible and cost-effective solution for the characterization of optoelectronic devices such as modulators, photoreceivers and integrated optical transceiver modules. With these new options, the MN4765B can be used with the MS4640B VectorStar® Vector Network Analyzer (VNA) family to perform optoelectronic measurements up to 70 GHz at both 1310 nm and 1550 nm wavelengths.


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Pasternack expands offering of general purpose VNA calibration kits

Pasternack, a leading manufacturer and supplier of RF, microwave and millimeter wave products, has expanded their portfolio of general purpose VNA calibration kits with new 50 and 75 Ohm versions. These new cal kits offer excellent performance characteristics that are specially designed for the fine-tuning and calibration of sensitive test equipment in engineering labs, production environments and quality testing facilities. All of Pasternack’s calibration kits are built to withstand years of rigorous use and provide accurate RF equipment calibration for the life of the product.


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Agilent Technologies' automatic fixture removal option enables industry's fastest, easiest non-coaxial device measurement

Agilent Technologies Inc. announced the availability of a powerful new automatic fixture removal (AFR) option for its PNA Series network analyzers. Previously available only in Agilent’s Physical Layer Test System (PLTS) software, the error-correction technique is the industry's fastest, easiest way to accurately measure non-coaxial devices, saving engineers time and money.


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