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Agilent Technologies Inc. announced an agreement with Auriga Measurement Systems to jointly develop and market integrated device-modeling systems for the semiconductor industry. The companies plan to pair Agilent's IC-CAP parameter extraction and device-modeling software and instrumentation with Auriga's test instrumentation. The first system planned is a pulsed-bias/pulsed-RF solution for isothermal characterization and modeling.
As part of this agreement, Auriga plans to develop software modules for Agilent's IC-CAP software, providing measurement and hardware drivers to allow data acquisition, and new device-model extraction routines for Auriga device models. Auriga also plans to port its Tajima advanced field effect transistor (FET) model into Agilent's Advanced Design System (ADS) and IC-CAP device-modeling software. This is to allow for advanced RF and microwave circuit and system simulations and for efficient model parameter extractions.
"Agilent remains committed to the device modeling market, with industry-leading modeling and simulation software and precision instrumentation," said Marc Petersen, marketing manager at Agilent's EEsof EDA division. "We look forward to our association with Auriga. Its modeling and device-characterization expertise provides the semiconductor industry with additional modeling technology as well as system integration and support services."
"For device models to keep up with the demands of today's designers and systems, we need to improve the device model as well as the measurements that drive the model," said Dr. Yusuke Tajima of Auriga. "The work in our lab has shown that only a truly isothermal model data acquisition system can provide a consistent data set. Pulsed IV and pulsed S-parameters are critical to better models."