Tektronix visits Microwave Journal

Technical Marketing manager, Darren McCarthy explains the new capability of the latest Tektronix Spectrum Analyzers.

Tektronix visits with Microwave Journal Editors

An audiocast discussion between Darren McCarthy, Technical Marketing Manager, Tetronix and David Vye, Editor, Microwave Journal

The explosion of digital RF has created a highly complex technology environment that is moving from the design bench to the field, requiring the need for next generation test and measurement instruments. DPX waveform image processing provides a unique live RF view of the spectrum, enabling an unprecedented RF signal discovery capability for a broad range of applications including radio communications and spectrum management.

Post a comment to this article