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Tektronix visits Microwave Journal

Technical Marketing manager, Darren McCarthy explains the new capability of the latest Tektronix Spectrum Analyzers.

July 16, 2008
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Tektronix visits with Microwave Journal Editors

An audiocast discussion between Darren McCarthy, Technical Marketing Manager, Tetronix and David Vye, Editor, Microwave Journal

The explosion of digital RF has created a highly complex technology environment that is moving from the design bench to the field, requiring the need for next generation test and measurement instruments. DPX waveform image processing provides a unique live RF view of the spectrum, enabling an unprecedented RF signal discovery capability for a broad range of applications including radio communications and spectrum management.

Recent Articles by David Vye

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