Tektronix visits with Microwave Journal Editors

An audiocast discussion between Darren McCarthy, Technical Marketing Manager, Tetronix and David Vye, Editor, Microwave Journal

The explosion of digital RF has created a highly complex technology environment that is moving from the design bench to the field, requiring the need for next generation test and measurement instruments. DPX waveform image processing provides a unique live RF view of the spectrum, enabling an unprecedented RF signal discovery capability for a broad range of applications including radio communications and spectrum management.