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Test and Measurement

Rohde & Schwarz and Optimum Semiconductor Technologies Verify LTE User Equipment Physical Layer Implementation At CTIA Wireless 2011

March 21, 2011
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CTIA Wireless 2011 — Rohde & Schwarz today announced a joint demonstration with Optimum Semiconductor Technologies Inc. of LTE User Equipment (UE) Physical layer (PHY) testing at Rohde & Schwarz booth #2814. Optimum Semiconductor Technologies Inc. is a division of Wuxi DSP and provider of wireless device solutions based on the Sandblaster® DSP Platform.

The demonstration features Optimum Semi’s PCI-e form factor MIMO LTE design with Rohde & Schwarz’s R&S®SMU200A Vector Signal Generator and R&S®FSV Signal and Spectrum Analyzer. Rohde & Schwarz signal generation and analysis solutions are used for testing the RF and digital baseband infrastructure, devices and all related components during development and production. Optimum Semi’s "Soft-PHY" card executes all Physical layer processing in software, providing the flexibility to support multi-standard, multi-mode operation as a true software defined radio (SDR) device.

Optimum Semi’s LTE PCI-e Card is stimulated by a standard-compliant 10 MHz LTE MIMO RF signal generated by the R&S®SMU200A. By decoding downlink control channels and the appropriate Downlink Control Information (DCI) format the data is demodulated and the encoded HD video is displayed. The flexibility of the LTE air interface is demonstrated using the built-in fading and noise capabilities of the R&S®SMU200A. Both static and dynamic scenarios are demonstrated. In the dynamic scenario, the assigned resources, resource allocation type and modulation and coding scheme are changed to overcome the impact of fading and noise.

A further aspect of this demonstration includes Optimum Semi’s Soft-PHY decoding the embedded uplink scheduling grant and generating an appropriate uplink signal. This uplink signal is then demodulated and decoded with the R&S®FSV Signal and Spectrum Analyzer. Flexibility is given by using either the built-in instrument option or the EUTRA/LTE analysis software that controls the instrument remotely.

“This joint demonstration with Optimum Semiconductor Technologies shows the great flexibility of our test and measurement solutions for LTE/LTE-Advanced signal generation and analysis.” said Andreas Pauly, Head of R&D Signal Generator Baseband Development at Rohde & Schwarz. “The intuitive Graphical User Interface (GUI) that allows changing all physical layer parameters on the fly, in combination with the dual-channel concept and its fading and noise capabilities makes the SMU200A one of the most comprehensive test solutions in the market.”

“The development flexibility afforded by our Soft-PHY allowed us to accelerate completion of our LTE development, and through the capability brought to the project by Rohde & Schwarz’s LTE signal generation and analysis equipment we achieved a fully independent validation of the conformance for our LTE Soft-PHY solution” said Stuart Stanley, Director of Engineering & Product Development at Optimum Semiconductor Technologies. “The ease of use allowed us to rapidly verify that we clearly surpassed our performance targets across a multitude of scenarios. This is something we would not have accomplished so effectively without Rohde & Schwarz equipment.”

More information on the R&S LTE product portfolio can be found at http://www2.rohde-schwarz.com/. Information concerning Optimum Semi’s Portfolio of Soft-PHY wireless devices and UE solutions is available by contacting info@optimumsemi.com or by visiting www.optimumsemi-tech.com

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