David Vye, MWJ Editor
David Vye, MWJ Editor RSS FeedRSS

vye_tsinghua

David Vye is responsible for Microwave Journal's editorial content, article review and special industry reporting. Prior to joining the Journal, Mr. Vye was a product-marketing manager with Ansoft Corporation, responsible for high frequency circuit/system design tools and technical marketing communications. He previously worked for Raytheon Research Division and Advanced Device Center as a Sr. Design Engineer, responsible for PHEMT, HBT and MESFET characterization and modeling as well as MMIC design and test. David also worked at M/A-COM's Advanced Semiconductor Operations developing automated test systems and active device modeling methods for GaAs FETs. He is a 1984 graduate of the University of Massachusetts at Dartmouth, with a concentration in microwave engineering.

EumW Conference Starts, Exhibition Set-up for Tuesday Opening

September 27, 2010
Delegates were busy registering and attending the Monday sessions today as work crews unpacked displays and began building the stands for the 2010 exhibition. By mid-morning set-ups were progressing without much drama, in anticipation of the Tuesday opening.

Since there are an impressive number of European Microwave companies engaged in nonlinear device characterization and the development of related test systems, it is appropriate that the European Microwave Week exhibition will feature a sizable representation of companies offering load-pull and related test solutions. Several of these companies were mentioned in last March’s cover story on non-linear Characterization and device modeling including Mesuro, NMDG, AMCAD and Verspecht-Teyssier-DeGroote. Each of these companies has developed the test systems and software for measuring transistor behavior under large signal conditions and generating compact or behavioral models, such as the Cardiff or poly-harmonic distortion (PHD) models. North American companies such as Maury Microwave of California and Focus Microwave of Canada will also be at the show along with the major test equipment vendors that these specialized partner with (i.e. Agilent, Rohde & Schwarz and Anritsu).

And so, just in time for the exhibition, NMDG has just announced the release of their new ICEBreaker application, which provides comprehensive visualization of measurement data sets. This application, which is free, can be upgraded to perform generic sweep plans such as DC, power and/or loadpull sweeps, and to collect measurement data in an accurate way. In addition, the company announced that nonlinear characterization under pulsed DC and pulsed RF conditions is now available in the NMDG ICE software platform, implemented to work with different types of receivers and pulsers.NMDG will be presenting live demos of the NM600 Fast Source and Load Pull under pulsed conditions and of the S-functions model extraction under mismatched conditions using the NM300 ZVxPlus solution this week at Rohde & Schwarz Booth #70 during the conference.

Post a comment to this article