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A Four-port Microwave Measurement System to Speed On-wafer Calibration and Test

Description of a new multiport calibration technique utilizing a four-port wafer-probe system
TECHNICAL FEATURE A Four-port Microwave Measurement System to Speed On-wafer Calibration and Test A four-port measurement system comprising an inexpensive coaxial switch matrix and a comprehensive free software package extends the capabilities of a user's two-port automatic network analyzer and probe station to three- and four-port measurements. The software...
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