ARTICLES

Modeling of Metal and Substrate Losses in CMOS and BiCMOS Inductors for RFICs

An improved lumped-element equivalent circuit of silicon integrated inductors that accurately characterizes effects on the quality factor of the electromagnetic coupling between the metal strips and substrate
Technical Feature Modeling of Metal and Substrate Losses in CMOS and BiCMOS Inductors for RFICs Paolo Arcioni, Rinaldo Castello, Luca Perregrini, Enrico Sacchi and Francesco Svelto Please click here to view the pdf file of the Technical Feature...
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