From RF to Terahertz: Advances in On-wafer S-parameter Measurement Technologies in China and Abroad April 10, 2025 Aihua Wu, School of Aerospace Science and Technology, Xidian University and The 13th Research Institute of China Electronics Technology Group Corp., Hai Wang, School of Aerospace Science and Technology, Xidian University, and Chen Liu, Department of Metrology and Maintenance, The 13th Research Institute of China Electronics Technology Group Corporation 0 Comments
