Co-existence Tests for S-Band Radar and LTE Networks August 13, 2014 Steffen Heuel and Andreas Roessler, Rohde & Schwarz, Munich, Germany No Comments
Artificial Intelligence and Machine Learning Add New Capabilities to Traditional RF EDA ToolsBy Contributions by Altair, ANSYS, Cadence/AWR, Keysight and MathWorksSubscribe
A Microelectromechanical Switch with Metamaterial Contacts, Part III: Reducing StictionBy Shiban K. Koul and Pranav K. Srivastava, C.A.R.E, Indian Institute of Technology, Delhi, India and Ajay K. Poddar and Ulrich L. Rohde, Synergy Microwave, N.J., U.S.
RLC Parameter Extraction Using the Transfer MatrixBy Brian Walker, Copper Mountain Technologies, Indianapolis, Ind.
