Home » Authors » N.D. du Toit, R. Thomas, J.H. Smith, F.N. Schirk and J.A. Mogel, AR RF/Microwave Instrumentation Souderton, PA

N.D. du Toit, R. Thomas, J.H. Smith, F.N. Schirk and J.A. Mogel, AR RF/Microwave Instrumentation Souderton, PA

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Design of Solid-state, Wideband, High-power Microwave Amplifiers for Radiated Immunity Testing

This article illustrates how the requirements for amplifiers used in immunity testing are dictated by various EMC standards. A case is made for using solid-state devices rather than tubes. An overview of new transistor technologies is included, showing...

July 11, 2010

N.D. du Toit, R. Thomas, J.H. Smith, F.N. Schirk and J.A. Mogel, AR RF/Microwave Instrumentation Souderton, PA

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EMC standards are created to verify the reliability of electronic equipment. The standards need not only dictate the test levels and requirements, but must specify test equipment, configuration and requirements. There exist countless possible RF threats, usually in the form of transmitters, most of which are narrow band. Because...