Articles by National Instruments, Austin, Texas

AWR Connected™

AWR ConnectedAWR Connected™ for ANSYS now offers an integrated two-way link between ANSYS® HFSS™ and NI AWR Design Environment™, specifically Microwave Office circuit design software, enabling RF/microwave designers to seamlessly tie HFSS extracted S-parameters back into NI AWR software. This integration unites two industry-standard design tools, HFSS full-wave electromagnetic (EM) field simulation and Microwave Office, to quickly and accurately simulate microwave circuits.  


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7½-Digit DMM: NI PXIe-4081

Flash-page-0NI announced the NI PXIe-4081 7½-digit high-performance DMM and 1.8 MS/s isolated digitizer. The NI PXIe-4081 is the first PXI Express DMM available. It offers engineers the flexibility, resolution and isolation needed to tackle challenging applications that require smarter test systems. The NI PXIe-4081 is the industry’s most accurate 7½-digit DMM, with an industry-leading 15 ppm accuracy for DC V measurements up to two years after calibration.


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Vector Signal Analyzer: NI PXIe-5668R

NI PXIe-5668RThe NI PXIe-5668R vector signal analyzer (VSA) offers 765 MHz of bandwidth with best-in-class measurement performance and speed. This high-performance microwave signal analyzer meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence.
 


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CompactDAQ

CompactDAQGain the flexibility you need to build a measurement system that meets your application-specific requirements. The CompactDAQ controllers integrate a processor and removable SD storage with high-quality signal conditioned measurements and digital, counter, and communication bus I/O in a small, rugged enclosure. You can reduce system cost and complexity while increasing accuracy.


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National Instruments UK & Ireland hosts Automated Test Summit 2014

National Instruments UK & Irelandwill host industry experts and test professionals at the Automated Test Summit 2014 on 19th June at the Madejski Stadium, Reading, UK. The event will allow delegates to learn about the top trends and technologies influencing automated test through informative presentations, technical discussions and ten hours of hands-on training.


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