Articles by National Instruments, Austin, Texas

National Instruments

Fundamentals of Building a Test System: System Maintenance

In a perfect world, systems would never fail. Unfortunately, this is not reality—at least not yet. Systems fail and sudden, unexpected failures can be costly. Although you cannot completely remove the risk of failure, even with the most well-thought-out plans, you can reduce it. Ensure you have a maintenance strategy that can help you manage cost if something does go wrong and reduce the risk of failure.


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Fundamentals of Building a Test System: System Maintenance

In a perfect world, systems would never fail. Unfortunately, this is not reality—at least not yet. Systems fail and sudden, unexpected failures can be costly. Although you cannot completely remove the risk of failure, even with the most well-thought-out plans, you can reduce it. Ensure you have a maintenance strategy that can help you manage cost if something does go wrong and reduce the risk of failure.


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NI Releases Test Software for the Latest IEEE 802.11ax Draft Standard

Test Software: WLAN Test Toolkit 17.0

NI announced the WLAN Test Toolkit 17.0 with support for Draft 1.1 of the IEEE 802.11ax standard. Combined with NI’s second-generation Vector Signal Transceiver (VST), the WLAN Test Toolkit 17.0 supports 802.11ax waveform generation and analysis for characterization, validation and production test of products, such as RF front end components, wireless modules and user devices, that implement Draft 1.1 of the IEEE 802.11ax standard.


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National Instruments

University of Bristol and Lund University Partner to Set World Records in 5G Wireless Spectral Efficiency

To address our rapidly approaching, hyper-connected future and the unprecedented demand on current 4G wireless networks, researchers at the University of Bristol and Lund University set out to test the feasibility of massive MIMO as a viable technology for 5G networks. Using the NI MIMO Prototyping System, the team was able to rapidly test new ideas on their way to implementing the world’s first live demonstration of a 128-antenna, real-time massive MIMO testbed and set two consecutive world records in spectral efficiency.


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NI STS

Bridging the Gap between RF Front-End Module Characterization and Production Test with the Semiconductor Test System

With the modern mobile device revolution, semiconductor suppliers are challenged to increase capability, integration, and performance while reducing time to market. Test needs a new approach based on an open, flexible platform at significantly lower cost. NI is bridging this gap by building on the stability and capability of the PXI platform to deliver off-the-shelf modular technology to both the characterization and production engineer.
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