ARTICLES

Design Enablement for RF and Microwave IC Design: Part II

This two-part series from Jazz Semiconductor presents recent developments in design-support methodology from a pure-play wafer foundry specializing in RFCMOS and advanced CMOS technologies, including BiCMOS, SiGe BiCMOS and high voltage CMOS. In this s...
Variations in semiconductor manufacturing technology are unavoidable; therefore, the IC must be designed for yield even at the extremes of process variation. The goal of statistical and corner models is accurate simulation of the process-induced variation of circuit performances, such as gain-bandwidth products, distortion levels and phase noise. Process...
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