Home » Authors » J. Rodriguez-Tellez, N.T. Ali and K.A. Mezher, Etisalat College of Engineering; T. Fernandez, A. Mediavilla, A. Tazon and G. Rafael, Universidad de Ca

J. Rodriguez-Tellez, N.T. Ali and K.A. Mezher, Etisalat College of Engineering; T. Fernandez, A. Mediavilla, A. Tazon and G. Rafael, Universidad de Ca

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Dependency of IV Characteristics of a MESFET Device on Frequency and Electric Field

A new automated system for observing the dependence of the IV characteristics of GaAs MESFET devices on electric field, frequency and thermal effects is presented. The new procedure employs a pseudo-random pulse I/V measurement system. The results prov...

November 1, 2003

J. Rodriguez-Tellez, N.T. Ali and K.A. Mezher, Etisalat College of Engineering; T. Fernandez, A. Mediavilla, A. Tazon and G. Rafael, Universidad de Ca

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In this article, a new pulsed I/V measurement technique for observing the dependence of the IV characteristics of a MESFET device on frequency, electric field and self-heating effects is presented. The results obtained with the new procedure are compared with experimental data obtained with conventional pulsed and static IV...