White Papers

Fundamentals of Building a Test System: System Maintenance

In a perfect world, systems would never fail. Unfortunately, this is not reality—at least not yet. Systems fail and sudden, unexpected failures can be costly. Although you cannot completely remove the risk of failure, even with the most well-thought-out plans, you can reduce it. Ensure you have a maintenance strategy that can help you manage cost if something does go wrong and reduce the risk of failure.


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Cable Harness EMC/EMI

Bundles of electrical cables in vehicles, aircraft, ships and buildings pose electromagnetic compatibility and interference challenges to the electrical design engineer. Due to their lengths, they are more likely to radiate or pick up irradiation than many other electrical components and systems. This white paper will discuss how these challenges can be met with the aid of electromagnetic simulation.


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Skyworks

5G in Perspective – A Pragmatic Guide to What’s Next

This paper examines the current state of LTE networks and the ways it could evolve to deliver a gigabit-per-second user experience. To accomplish this, the ecosystem will need to deliver 100x data throughput improvement. As a premier provider of RF front-end solutions, Skyworks believes we have the capability to enable this evolution using tools and techniques provided in the LTE specification leading up to the release of 5G. Additionally, this paper explores the impact of new 5G services from the mobile and fixed wireless perspective.


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Keysight

Applying a Very Wide-Bandwidth Millimeter-Wave Testbed to Power Amplifier DPD

5G designs that use wide-bandwidth digital modulation require new test technologies. Our latest 5G whitepaper presents a testbed for generating and analyzing millimeter-wave signals with 8 GHz bandwidth. We used it to generate V- and E-band signals and apply digital pre-distortion (DPD) algorithms, achieving impressive improvements in ACPR and EVM.
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National Instruments

Hardware and Measurement Abstraction Layers

Hardware abstraction layers (HALs) and measurement abstraction layers (MALs) are some of the most effective design patterns to make test software as adaptable as the hardware. Rather than employing device-specific code modules in a test sequence, abstraction layers give you the ability to decouple measurement types and instrument-specific drivers from the test sequence. Learn how to drastically reduce development time by giving hardware and software engineers the ability to work in parallel.


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