Articles Tagged with ''measurement''

NI drives down cost of wireless production test

NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, released the Wireless Test System (WTS), a solution that dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.


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Copper Mountain Technologies debuts new high-performance VNAs

 Copper Mountain Technologies introduced a new series of high-performance vector network analyzers (VNAs) designed to efficiently handle advanced test applications at the 2015 International Microwave Symposium (IMS) in Phoenix on May 17-22. The Cobalt series, which presently features the C1220 and C1209 models, offers an unmatched price-performance combination for S-parameter measurement between 100 kHz and 20 GHz. 


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Keysight works with MediaTek on mobile chipset manufacturing test solution

Keysight Technologies Inc. announced that it has worked with MediaTek on the release of a manufacturing test solution for the MediaTek MT6735 mobile chipset, based on the Keysight E6640 EXM wireless test set. The MT6735, released in October of 2014, is an LTE 64-bit mobile SoC platform with integrated modem, RF and CorePilot™ technology, for use by global operators targeted at the emerging mid-range smartphone market called, Super-mid. The MT6735 builds upon MediaTek's existing LTE platform by adding CDMA2000 to create WorldMode modem capability.


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