Articles Tagged with ''characterization''

Keysight's latest release of semiconductor device modeling and characterization software

Keysight Technologies Inc. announced the newest release of its industry-leading device modeling and characterization software suite: Integrated Circuits Characterization and Analysis Program (IC-CAP) 2016, Model Builder Program (MBP) 2016, and Model Quality Assurance (MQA) 2016. The software release provides designers characterizing and modeling semiconductor devices with further advances in modeling and characterization efficiency.


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Focus Microwaves acquires Mesuro

Focus Microwaves announced it has expanded its base of high-frequency measurement and modeling technologies through the acquisition of Cardiff, UK-based Mesuro, a leader in the development of RF/microwave and high-speed-digital device modeling, characterization and optimization solutions.


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Lake Shore to discuss THz characterization and high-frequency probing at IRMMW-THz

 Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced that it will be exhibiting solutions for high-frequency material characterization at the 39th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Sept. 14–19, in Tucson, Ariz. 


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Vector Network Analyzer: VectorStarâ„¢ ME7838E

Test & Measurement

Anritsu_ME7838E_Front

Anritsu Co. introduces the VectorStar™ ME7838E vector network analyzer (VNA) broadband system that provides frequency coverage from 70 kHz to 110 GHz in a single connection. Incorporating all the benefits of the VectorStar ME7838 series broadband system, the ME7838E addresses the challenges associated with today's high-speed device characterization.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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