Waves of innovation is the theme of this year’s European Microwave Week (EuMW), taking place from September 21–26 in Utrecht, The Netherlands. This leading annual event brings together experts in microwaves, RF, wireless and radar technologies for a week of exhibitions, workshops and technical sessions. Ampleon looks forward to seeing you there!

As a global leader in RF power technology, Ampleon will showcase its latest LDMOS and GaN RF power solutions at booth #E076 during EuMW 2025 from September 23 to 25.

This year, Ampleon will highlight innovations for base stations, radar, industrial and scientific applications. Our experts will be showcasing high-efficiency GaN solutions for massive MIMO and Macro finals, compact 50 V LDMOS Doherty drivers, the ultra-compact ART4K0FX solution for 13.56 MHz, GaN-on-SiC HEMTs delivering over 700 W for radar applications, and solid-state PA high-power GaN solutions for industrial heating and particle accelerators.

Ampleon technical experts will be part of the conference program:

Sunday, Sept. 21, 2025 / Room Beam
Workshop Thermal Effects and Heat Management in Active Phased Arrays: Chip, Package and Antenna Level Concepts
08:30 – 17:50 Thermal Modeling and Characterization of GaN and LDMOS Power Amplifiers
Amir Mirza Gheytaghi, Ampleon 

Monday, Sept. 22, 2025 / Room: Auditorium 
6G Forum
Chair: Prof. Bart Smolders (Eindhoven University of Technology)
Organizing committee: Ulf Gustavsson (Ericsson), John Gajadharsing (Ampleon), Jos Berière (TNO/ FNS-6G) and Bart Smolders (Eindhoven University of Technology
6G technologies, Sub-6 towards 7-24 GHz, (FR1, FR3) 
14:50 – 15:20 New semiconductor technologies for improved power efficiency,
Fred van Rijs, Ampleon

Tuesday, Sept. 23 / Hall 7
 Interactive Poster Session
 EuMIC/EuMC03-12 Thermal Resistance Estimation for AlGaN/GaN HEMTs with Trapping Effects
Zhijian Yu and Amir Mirza Gheytaghi, Ampleon

Wednesday, Sept. 24 / Room Polar
EuMC36 MTT-ISTP Panel Session: Photovoltaic Power Orbital Station – A Future at Reach with Microwaves?
MC37-4 Thermal Characterization of Radio Frequency Power Amplifier with Thermal Transient Test
Amir Mirza Gheytaghi & Vittorio Cuoco, Ampleon, et al.