Langer EMV-Technik GmbH presents the industry’s first passive near-field probe with a measuring range of up to 40 GHz.
The HR-E 40-1 probe is designed for measurements of high frequency, electrical near fields in the frequency range up to 40 GHz on conductors, ICs, metallic housings and RF structures. The HR-E 40-1 near-field probe is suitable for measurements on high frequency structures during development, such as analyses of the harmonics of 5G assemblies, for example. It allows you to specifically record the electric near fields and derive a detailed field image of the structure to be measured.
The probe tip is decoupled from the probe shaft by special damping systems. In addition, the probe contains a sheath current attenuation. The newly developed probe head ensures a defined distance of 0.5 mm even for hand-held measurements. The HR-E 40-1 allows a spatial resolution of 0.2 mm and transmits the measured signals to the measuring device.
The transmission behavior of the near-field probe is almost constant in the frequency range from 8 to 40 GHz and thus enables reproducible measurement results, for example to verify and refine simulation models.
For spatially reproducible measurements, the probe can be used in an automatic positioning system, for example in a Langer scanner. The probe is to be used with the SH 01 probe holder in the scanner. The HR-E 40-1 near-field probe can be calibrated using the Langer Stripline CPL 40-01 38.
The passive near-field probe is supplied in a set consisting of the operating manual, the HR-E 40-1 probe and the USB stick with the probe characteristics.