Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors, announces its participation in the upcoming GOMACTech 2015 Conference. GOMACTech will take place March 23-26 at the Union Station Hotel in St. Louis, Mo.

At the show, Accel-RF will showcase its Automated Multi-Channel RF-Biased Burn-in Test System for accelerated-aging and parametric testing of RF semiconductor devices, as well as its Test Characterization Docking Station that is plug-and-play compatible with a family of test fixtures, including fixtures for CMOS mixed-signal characterization testing. The system architecture for these products is derived from the highly developed and field-proven measurement platform product, AARTS. Accel-RF has supplied AARTS equipment to top-tier manufactures worldwide for over 12 years.

Updates and specific activities planned during GOMAC will be posted on the website as additional information becomes available.