What: Agilent Technologies engineers and executives will participate in a variety of workshops and panel presentations at the annual 2006 IEEE Microwave Theory and Techniques Society (MTT-S) IMS conference.

When: June 11-16, 2006

Where: Moscone Convention Center, San Francisco, CA


Dueling Dualities: How to Best Marry Time-Domain System-Level Verification With Frequency-Domain RF Circuit Simulations
Niranjan Kanaglekar, Agilent Technologies will be a panel member.

The panel will discuss pros and cons of various methods that enable system-level verification of RF circuits.

  • Wednesday, June 14, noon -- 1:20 p.m.

  • Moscone Convention Center Room 102-Gateway Ballroom


Multi-Chip Radio Module (MCRM) Design Methodology and Tools and Manufacturing Issues for Cellular Applications
Chris Mueth, Agilent Technologies will discuss wireless system simulation using Agilent EDA tools

  • Sunday, June 11; 8 a.m. - 5 p.m.

  • Moscone Convention Center, Rooms 224/226

Memory Effects in Power Amplifiers
Nonlinear Behavioral Models with Memory: Formulation, Identification and Implementation,
David E. Root, David Sharrit and Jan Verspecht, Agilent Technologies

  • Sunday, June 11, 8 a.m. - 5 p.m

  • Moscone Convention Center, Room 305

Practical Methods for Determining the Accuracy of Measurements
A Review Of Techniques Both Old and New Accommodating Component Uncertainties into Subsystem and System-level Specifications

B. Szendrenyi, Agilent Technologies

Managing Uncertainty Budgets and Using 'Buffer Zones' in Specifications
B. Szendrenyi, Agilent Technologies

  • Monday, June 12, 8 a.m. - 5 p.m.

  • Moscone Convention Center, Room 200

High Speed Digital Signal Integrity
Overview of High Speed Digital Systems and the Key Issues Facing Today's Designers
Mike Resso, Agilent Technologies

S-parameter Characterization of Operational Transmitters and Channels in Digital Communications Systems
Greg LeCheminant, Agilent Technologies

  • Monday, June 12, 8 a.m. - 5 p.m.

  • Moscone Convention Center, Room 222

Passive and Active Differential Measurements: State-of-the-Art and Applications
Non-linear Differential Device Characteristics: Measurements and Models
Joel Dunsmore, Agilent Technologies

  • Monday, June 12, 1 - 5 pm.

  • Moscone Convention Center, Rooms 202/210

Technical Session Papers:

  • Measurement-Based Non-Quasi-Static Large-Signal FET Model Using Artificial Neural Networks J. Xu, D. Gunyan, M. Iwamoto, A. Cognata, D. Root, Agilent Technologies

  • Linearity Improvement of HBT based Doherty Amplifiers using a Simple Analytical Model

Y. Zhao, P. Asbeck, University of California, San Diego;

A. Metzger, P. Zampardi, Skyworks Inc.; M. Iwamoto, Agilent Technologies

  • A Calibrated Microwave Directional Bridge for Remote Network Analysis through Optical Fiber, T.S. Marshall, R. Van Tuyl, Agilent Technologies Inc.

  • Why Reciprocal Procedure Works?

T. Jamneala, D.A. Feld, B. Zaini, Avago Technologies Inc.;

D. Blackham, K.H. Wong, Agilent Technologies Inc.